Non-Zero Syndrome Encoding for Decodable Storage Test Patterns
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Solution Overview
Problem
The existing methods for testing storage devices are time-consuming due to the need to write, test, and rewrite storage media with test patterns that are not valid codewords, requiring additional processing steps before shipping.
Innovation Solution
Implementing a system that uses non-zero syndrome based encoding and decoding circuitry to create decodable test patterns and user data sets, allowing test patterns to be written directly to storage media without the need for re-writing with decodable data sets, by aggregating test and user data with specific seed patterns and using a syndrome value for encoding and decoding.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If test patterns are written to storage medium for testing, then testing can be performed, but the test patterns are not valid codewords and require re-writing with valid codewords before shipping
Solution Approach 1:
The patent merges the test pattern data with a test seed pattern to create a combined test codeword that is both a valid codeword and contains the necessary test pattern information. This eliminates the need for separate re-writing operations while maintaining testing capability.
Solution Approach 2:
The encoding system is designed to handle both user data and test data through the same encoding path. By using a universal encoder that can process both types of data with appropriate seed patterns, the system achieves multi-functionality without requiring separate processing paths or re-writing operations.
2Reliability
If test patterns are written to storage medium, then testing can be performed, but additional re-writing steps are required before shipping
Solution Approach 1:
The test pattern and test seed are merged into a single valid test codeword that can be written once and used for both testing and final product delivery, eliminating redundant re-writing steps and improving shipping efficiency.
Solution Approach 2:
The test codeword is preliminarily encoded with the test seed included in its structure before writing to the storage medium. This preliminary encoding ensures the data is ready for both testing and final shipment without requiring additional processing steps later.
3Reliability
If test patterns are used for testing, then testing can be performed, but the storage medium must be re-written with decodable data sets
Solution Approach 1:
The test pattern, test seed, and encoding are merged into a single decodable test codeword structure. This unified structure eliminates the need for separate re-writing operations with different data sets, reducing processing steps and system complexity.
Solution Approach 2:
The same encoding and decoding circuits used for user data are universally applied to test data. By making the processing path universal, the patent eliminates the need for specialized re-writing operations and reduces overall device complexity.
Data Source
AI summary
The present invention is related to systems and methods for harmonizing testing and using a storage media. As an example, a data system is set forth that includes: a data decoder circuit, a data processing circuit, and a write circuit. The data decoder circuit is configured to decode a test data set to yield a result. The data processing circuit is configured to encode a user data set guided by the result to yield a codeword. The write circuit is configured to store an information set corresponding to the codeword to a storage medium.