NPU Runtime Aging Tests for Early Defect Detection
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Solution Overview
Problem
Current methods for testing neural processing units (NPUs) primarily occur before shipment and do not effectively detect minor defects, which can lead to unpredictable AI operation in mission-critical applications like autonomous driving vehicles, drones, and AI robots due to amplified defects from fatigue or physical stress over time.
Innovation Solution
A method for performing an aging test on NPUs and System on Chip (SoCs) with runtime capabilities, involving scan tests and memory tests to identify defective components, repeated to simulate stress and ensure reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If aging tests are performed repeatedly during runtime, then defect detection capability is improved, but system operational time is reduced due to testing interruptions
Solution Approach 1:
The patent implements periodic aging tests during NPU runtime by activating test modes at predetermined intervals. The controller schedules scan tests and memory tests to execute periodically, allowing defect detection while maintaining overall system operation. This periodic testing approach balances the need for defect detection with maintaining system operational time.
2Measurement precision
If scan tests and memory tests are performed on all functional components, then defect detection coverage is improved, but test execution time is increased
Solution Approach 1:
The patent applies local quality by selectively testing specific functional components based on their operational status and risk profiles. The controller identifies and tests only those components that are currently active or have higher defect probabilities, rather than uniformly testing all components. This targeted approach improves defect detection coverage for critical areas while reducing overall test execution time.
3Ease of manufacture
If aging tests are performed before shipment only, then manufacturing process simplicity is maintained, but defect detection timing is delayed
Solution Approach 1:
The patent implements preliminary action by performing initial aging tests during the manufacturing process before shipment, in addition to runtime testing. This ensures that obvious defects are caught early in the manufacturing stage, maintaining manufacturing simplicity for critical defects while enabling more comprehensive defect detection through subsequent runtime testing.
Data Source
AI summary
Provided is a method for performing an aging test on a neural processing unit (NPU) with a capability of a runtime test. The method may comprise: performing an aging test on the NPU which comprises a plurality of functional components. The plurality of functional components may comprise at least one memory and plural processing elements. The performing of the aging test may include: performing a scan test on the NPU to verify whether at least one functional component in the NPU is defective or not; and performing a memory test on the at least one memory. At least one of the scan test and the memory test may be repeatedly performed to put a stress on the NPU for the aging test. The aging test may be repeated by a predetermined number.