Self-Assembled Nucleic Acid Pattern Repair for Sub-50 Nm Lithography

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Solution Overview

Problem

Conventional lithographic processes face challenges in fabricating nanostructures with feature dimensions less than 50 nm, due to high costs and limited capability in forming structures with such small dimensions.

Innovation Solution

The method involves forming self-assembled nucleic acids on a substrate and using repair enzymes to reduce defect density, allowing the nucleic acids to serve as templates for transferring patterns to the substrate with dimensions less than 50 nm.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional lithographic processes are used to fabricate nanostructures with feature dimensions less than 50 nm, then manufacturing capability is maintained, but cost increases significantly and productivity decreases

Engineering Contradiction:
Improvefeature dimensionVSAvoidfabrication speed
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent employs self-assembled block copolymers that automatically organize into periodic nanostructures through spontaneous phase separation. The block copolymer chains self-organize into well-defined domains (e.g., hexagonal, body-centered cubic, or double diamond patterns) with periodicities in the 5-50 nm range, eliminating the need for expensive lithographic tools and achieving both high precision and improved productivity

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent utilizes changes in physical parameters such as block copolymer composition, molecular weight, and processing conditions (temperature, solvent, annealing) to control the self-assembly process. By adjusting these parameters, the periodicity and morphology of the resulting nanostructures can be tuned to achieve desired feature dimensions less than 50 nm with high precision

Inventive Principle:
Principle #35Parameter changes

2Productivity

If self-assembled block copolymer lithography is used to fabricate nanostructures with dimensions less than 50 nm, then productivity improves, but defect density increases

Engineering Contradiction:
Improvefabrication speedVSAvoiddefect density
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent applies preliminary actions by carefully controlling the self-assembly process through pre-determined block copolymer formulations and processing conditions. The use of well-characterized block copolymers with controlled molecular weights and compositions ensures consistent self-assembly behavior, reducing defects before the actual patterning step

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent incorporates feedback mechanisms through iterative optimization of self-assembly conditions. By monitoring the self-assembly process and adjusting parameters such as annealing temperature, solvent composition, and processing time, the method achieves better control over defect formation and improves overall pattern fidelity

Inventive Principle:
Principle #23Feedback

3Manufacturing precision

If conventional lithographic processes are used, then manufacturing capability is maintained, but cost increases significantly

Engineering Contradiction:
Improvefeature dimensionVSAvoidfabrication cost
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent replaces expensive, complex lithographic equipment with inexpensive block copolymer materials that can be applied as thin films and processed using simple, low-cost techniques. The block copolymers serve as disposable self-organizing templates that can be synthesized economically and processed without requiring sophisticated infrastructure

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Solution Approach 2:

The patent substitutes mechanical lithographic systems (photolithography, e-beam lithography, shadow mask lithography) with a chemical self-assembly system. Instead of using mechanical or optical tools to pattern structures, the method relies on thermodynamic self-organization of block copolymers to spontaneously form the desired nanostructures

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the fabrication of nanostructures with low defect density and dimensions smaller than 50 nm, overcoming the limitations of conventional lithographic processes.

Implementation Method 1

self-assembled block copolymer lithography

Methodology Applied
Scientific EffectSelf-assembly: Self-Assembly

Implementation Method 2

The specificity of complementary base pairing in nucleic acids provides self-assembled nucleic acids that may be used for self-assembled nucleic acid lithography processes

Methodology Applied
Scientific EffectComplementary base pairing: Chemical Bonding

Data Source

PatentUS20250166993A1Methods of forming nanostructures utilizing self-assembled nucleic acids
Publication Date: 2025.05.22 MICRON TECHNOLOGY INC
  • US20250166993A1 patent drawing
  • US20250166993A1 patent drawing
  • US20250166993A1 patent drawing

AI summary

A method of forming a nanostructure comprises forming an initial pattern of self-assembled nucleic acids on a substrate. The initial pattern of self-assembled nucleic acid exhibits at least one defect. The initial pattern of self-assembled nucleic acids is contacted with at least one enzyme to repair the at least one defect and form a reduced defect pattern of self-assembled nucleic acids. The method also includes transferring the reduced defect pattern of self-assembled nucleic acids to the substrate to form a patterned substrate. At least one dimension of the pattern on the patterned substrate is less than about 50 nanometers (nm). Additional methods are also disclosed.