Configurable Non-Volatile Memory Testing and Repair System
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Solution Overview
Problem
Existing non-volatile memory testing and repair tools are limited in functionality, requiring manual coding for each distinct memory type, which is time-consuming and inefficient.
Innovation Solution
A configurable testing and repair system for non-volatile memory, comprising a memory testing device, a memory repair device, and a control device that automates test operations, generates defect data, and performs repairs based on predefined parameters and redundancy sectors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If manual coding is performed for each distinct memory type, then testing and repair functionality is achieved, but time consumption increases significantly
Solution Approach 1:
The system employs a universal controller that can handle multiple memory types and manufacturers through a standardized interface. The controller reads memory specification files automatically and adapts its testing and repair operations based on the detected memory type, eliminating the need for separate manual coding for each memory variant.
Solution Approach 2:
The system performs self-configuration by automatically detecting memory parameters and generating appropriate test patterns without human intervention. The controller reads specification files, identifies memory characteristics, and autonomously sets up the testing environment, replacing manual coding operations with automated self-service functionality.
2Reliability
If existing testing tools are used for diverse memory manufacturers, then basic testing capability is maintained, but efficiency decreases due to repeated manual configuration
Solution Approach 1:
Memory specification files are prepared in advance containing all necessary parameters for different memory types. When a memory device is inserted, the controller automatically retrieves and applies the pre-prepared specification, eliminating repeated manual configuration and maintaining consistent testing reliability across different manufacturers.
Solution Approach 2:
Specification files serve as an intermediary between the controller and diverse memory devices. These files contain standardized parameter definitions that enable the controller to communicate effectively with different memory types without requiring manual reconfiguration, thus maintaining reliability while improving efficiency.
3Manufacturing precision
If manual coding is performed for each memory instance, then accurate repair operations are achieved, but overall yield decreases due to time loss
Solution Approach 1:
The controller automatically detects memory defects through diagnostic operations and self-generates repair configurations based on the detected fault patterns. This self-service approach maintains repair accuracy by using detector-specific parameters while eliminating manual coding time, thereby improving overall repair yield.
Solution Approach 2:
The system dynamically adjusts testing and repair parameters based on automatically detected memory characteristics and defect patterns. By changing parameters according to specific memory instances rather than using fixed manual configurations, the system maintains high repair accuracy while processing memories faster, thus improving yield.
Data Source
AI summary
A configurable testing and repair system for a non-volatile memory includes: a memory testing device capable of carrying a to-be-tested memory performs a test operation on the to-be-tested memory to determine whether or not the to-be-tested memory is a to-be-repaired memory that needs to be repaired, and performs a diagnostic operation on the to-be-repaired memory, so as to generate defect data including a fault address and a fault data value; a memory repair device capable of carrying the to-be-repaired memory performs a repair operation on the to-be-tested memory according to the defect data; and a control device connected to the memory testing device and the memory repair device controls the memory testing device to perform the test operation and the diagnostic operation, and to control the memory repair device to perform the repair operation.