NVDIMM Test Adapter External Power Interposer
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Solution Overview
Problem
Existing automatic test equipment (ATE) testers lack sufficient power supply to test non-volatile dual in-line memory modules (NVDIMMs), which includes both volatile and non-volatile memories, due to insufficient power for the VDDSPD and VBACK rails, preventing comprehensive hardware testing.
Innovation Solution
A test adapter is designed to provide increased power to NVDIMMs using an external power supply, with a straddle connector or socket attached to an interposer or printed circuit board, ensuring sufficient current for SPD and backup voltage, and implementing a power on/off sequence to simulate system power states during testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Power
If ATE testers use standard power supply configuration, then device compatibility is maintained, but power delivery is insufficient for NVDIMM testing
Solution Approach 1:
A test adapter is introduced as an intermediary device between the ATE tester and the NVDIMM. The adapter includes a straddle connector that attaches to the tester socket and a device socket that receives the memory module. This intermediary provides additional power delivery capability through separate power contacts while maintaining compatibility with existing tester interfaces, thereby resolving the contradiction between power delivery requirements and system complexity.
Solution Approach 2:
The power delivery function is segmented into two independent pathways: the primary power path through the straddle connector contacts and the backup power path through dedicated power contacts on the adapter. This segmentation allows the system to provide sufficient total power for NVDIMM operation while keeping each individual power path manageable and compatible with existing tester capabilities.
2Power
If external power supply is added to provide sufficient current, then power requirements are met, but system complexity increases
Solution Approach 1:
The test adapter is designed to perform multiple functions through a single integrated structure: it provides mechanical support for the memory module, establishes electrical connections for data and control signals, delivers primary power through the straddle connector, and provides backup power through dedicated contacts. This multi-functionality reduces the need for separate components and minimizes overall system complexity while meeting all power requirements.
Solution Approach 2:
The adapter incorporates power management circuitry that automatically switches between primary and backup power sources based on availability and requirements. The device socket and connector design enable self-alignment and self-connection, reducing the need for complex external power management systems and simplifying the overall adapter structure.
3Reliability
If power sequence control is implemented, then safe operation is ensured, but control complexity increases
Solution Approach 1:
The adapter and test system implement preliminary power sequence control where the backup power is activated before the primary power, and primary power is deactivated after backup power is established. This preliminary action ensures that the NVDIMM has continuous power availability throughout the transition, preventing data loss or corruption while keeping the control logic straightforward and manageable.
Data Source
AI summary
Approaches, techniques, and mechanisms are disclosed for a test adapter designed to improve testability of non-volatile dual in-line memory modules (NVDIMM) on automatic test equipment (ATE) testers or in-system boards, which have inadequate power supplies. An NVDIMM includes both volatile memories and non-volatile memories. A test adapter is designed to supply increased power to an NVDIMM. A test adapter is implemented using an interposer or a printed circuit board (PCB) that may be inserted into a socket on an ATE tester or on an end-user system-level board. The interposer or PCB includes a power socket for attaching a power cable to supply the external power supply to the NVDIMM. A power on/off sequence is controlled by an ATE tester to simulate or test a system power on/off sequence. An external input power is always on, but both serial and backup power signals are only on during tests of an NVDIMM.