Non-volatile Memory Failure Diagnosis Using Complementary Data
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Solution Overview
Problem
High-reliability failure diagnosis in non-volatile memory devices is challenging, especially in integrated systems where distinguishing between sense amplifier failures and memory cell failures is necessary, particularly in safety-critical applications like vehicles, where data integrity and quick diagnosis are paramount.
Innovation Solution
A non-volatile memory device design incorporating a first block with test data, a second block with complementary data, differential sense amplifiers, a diagnostic circuit, and a control circuit that performs sense amplifier tests using test data and complementary data to differentiate between sense amplifier and memory cell failures, allowing for high-reliability failure diagnosis without increasing circuit size.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If data capacity of non-volatile memory device is increased, then storage capability is improved, but the size of collation circuit increases
Solution Approach 1:
The patent extracts only the critical portion of data (first data group and its complementary second data group) for collation purposes, rather than collating all stored data. This selective extraction allows the collation circuit to maintain a fixed, manageable size while the overall memory capacity can be scaled up by storing additional data in the same memory blocks without affecting the collation circuit complexity.
2Reliability
If failure diagnosis accuracy is improved by checking all data bits, then reliability is improved, but diagnosis time increases
Solution Approach 1:
The patent extracts and collates only the first data group and its complementary second data group for failure diagnosis, rather than checking all data bits. This selective approach maintains high diagnosis accuracy by focusing on critical data pairs that can indicate sense amplifier or memory cell failures, while significantly reducing the time required for complete data collation.
Solution Approach 2:
The patent performs preliminary collation of the first and second data groups before complete data verification. By quickly checking these specific data pairs first, the system can identify obvious failures early in the diagnosis process, reducing the average diagnosis time while maintaining reliability through subsequent more thorough checking if needed.
3Measurement precision
If sense amplifier test is performed using test data and complementary data, then failure distinction accuracy is improved, but circuit operation complexity increases
Solution Approach 1:
The patent uses complementary data (inverted logic values) in the second data group compared to the first data group. By writing identical patterns to both blocks and then reading complementary values, the system creates a controlled test condition where any deviation from expected complementary relationships clearly indicates failures. This inversion approach simplifies the test logic while improving failure distinction accuracy.
Solution Approach 2:
The patent changes the logical state parameter of the data by using complementary values in the second block. This parameter change creates a predictable relationship (XNOR equivalence) that simplifies the collation logic - the circuit only needs to verify that corresponding bits match or are proper complements, rather than implementing complex failure scenario analysis.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and efficient failure diagnosis, reducing execution time and circuit complexity, allowing for timely detection and response to failures in safety-critical systems by distinguishing between sense amplifier and memory cell issues.
Implementation Method 1
at least one differential sense amplifier that receives a first input signal and a second input signal and generates an output value based on a difference therebetween
Data Source
AI summary
A non-volatile memory device is provided, which includes a first block for storing a first data group including a test data, a second block for storing a second data group including a complementary data to the first data group, a differential sense amplifier for generating an output value based on a difference between two input signals, a diagnostic circuit for performing a failure diagnosis using a value from the differential sense amplifier, and a control circuit which performs control such that a signal based on the test data and the complementary data is set to the input signal of the differential sense amplifier and the diagnostic circuit executes a failure diagnosis of the differential sense amplifier. The non-volatile memory device performs a failure diagnosis with high reliability capable of distinguishing between a failure of sense amplifier and a failure of a memory cell.