Multi-State NVM Programming via Hot Carrier Injection Binning
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Solution Overview
Problem
Multi-state non-volatile memories (NVMs) face challenges in programming efficiency due to the lengthy process of achieving separated threshold voltage distributions for multiple programmed states, which complicates both programming and reading operations.
Innovation Solution
The method employs hot carrier injection (HCI) programming, where NVM cells are initially programmed and categorized into bins based on threshold voltage ranges, allowing for targeted programming pulses to achieve desired programmed states with minimal pulses, optimizing the separation of threshold voltages for efficient reading and writing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If multiple programmed states are implemented in multi-state NVM, then storage density and space efficiency are improved, but programming time and process complexity increase significantly
Solution Approach 1:
The patent segments the programming process into multiple distinct stages, where each stage programs cells to specific threshold voltage ranges. This segmentation allows systematic progression through multiple programmed states without attempting to program all states simultaneously, thereby reducing overall programming time while maintaining high storage density.
Solution Approach 2:
The patent employs preliminary classification of memory cells into bins based on their initial threshold voltage distributions before programming. This preliminary action enables tailored programming pulses to be applied to each bin, ensuring efficient programming to target states without unnecessary programming steps, thus reducing programming time while preserving multi-state capacity.
2Reliability
If sufficient separation in threshold voltage is achieved for multiple programmed states, then reading reliability is improved, but programming process complexity increases
Solution Approach 1:
The patent applies local quality by tailoring programming pulses to specific bins of memory cells based on their individual threshold voltage characteristics. Each bin receives customized programming parameters that ensure reliable separation of threshold voltage distributions for its target programmed state, maintaining reading reliability while managing programming complexity through localized rather than uniform programming approaches.
Solution Approach 2:
The patent utilizes parameter changes by adjusting programming pulse characteristics (such as voltage magnitude and duration) based on the specific bin and target programmed state. These parameter adjustments enable precise control over threshold voltage separation, ensuring reliable state differentiation without requiring overly complex programming processes.
3Quantity of substance
If programming pulses are applied to achieve multiple programmed states, then storage capacity per cell is improved, but programming speed decreases
Solution Approach 1:
The patent employs periodic action through its multi-stage programming approach, where programming pulses are applied in sequential stages rather than continuously. Each stage completes a specific programming task before the next stage begins, enabling efficient progression through multiple programmed states and maintaining programming speed while achieving high storage capacity per cell.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces the time required for programming multi-state NVMs by ensuring that cells can be reliably and quickly programmed to multiple states with precise voltage adjustments, enhancing the overall efficiency of memory cell programming.
Implementation Method 1
The NVM cells are programmed using hot carrier injection (HCI) programming pulses
Implementation Method 2
The NVM cells are erased using Fowler-Nordheim tunneling
Data Source
AI summary
A method is provided for programming a multi-state flash memory having a plurality of memory cells. A first programming pulse is provided to the flash array; determining a threshold voltage distribution for the plurality of memory cells after providing the first programming pulse. The plurality of memory cells is categorized into at least two bins based on a threshold voltage of each memory cell of the plurality of memory cells. A first voltage is selected for a second programming pulse for programming a first bin of memory cells of the at least two bins, the first voltage based on both a threshold voltage of the first bin and a first target threshold voltage. A second voltage is selected for a third programming pulse for programming a second bin of memory cells of the at least two bins, the second voltage based on both the threshold voltage of the second bin and on a second target threshold voltage.


