NVM Analog Block Trimming for Power-On Read Recovery
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Solution Overview
Problem
Existing non-volatile memory technologies face errors during power-on sequences that affect memory-related data, leading to incorrect configuration and lack of recovery mechanisms.
Innovation Solution
A method for selecting trimmings in non-volatile memories by iteratively applying and testing different sets of trimmings to analog blocks to achieve correct reading of memory-related data, using fixed patterns and CRC checks to ensure accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If trimmings are applied to analog blocks during power-on sequence, then configuration accuracy is improved, but errors in memory-related data may lead to incorrect configuration without recovery mechanism
Solution Approach 1:
The patent applies preliminary action by selecting and storing optimal trimmings in a lookup table before normal operation. During power-on sequence, the system retrieves pre-determined trimmings based on process variation measurements, avoiding the need to perform iterative selection during startup and enabling recovery from configuration errors.
Solution Approach 2:
The patent utilizes parameter changes by measuring process variations in analog blocks and using these measurements to select appropriate trimmings from a lookup table. The trimmings are adjusted as parameters based on the measured process variations, allowing the system to adapt to manufacturing tolerances and recover from configuration errors.
2Reliability
If iterative trimming selection is performed during power-on sequence, then reliability is improved through error recovery, but power-on time and initialization duration increase
Solution Approach 1:
The patent performs the time-consuming iterative trimming selection process before manufacturing completion, storing the results in a lookup table. During power-on sequence, the system only needs to retrieve pre-computed trimmings, dramatically reducing initialization time while maintaining the ability to recover from errors through the stored optimal configurations.
Solution Approach 2:
The patent prepares multiple candidate trimmings and their corresponding configurations in advance, cushioning against the possibility of power-on errors. When an error occurs during power-on, the system can switch to alternative pre-prepared configurations from the lookup table, enabling rapid recovery without time-consuming iterative selection.
3Manufacturing precision
If multiple sets of trimmings are tested to ensure correct reading, then manufacturing precision is improved, but device complexity and processing steps increase
Solution Approach 1:
The patent creates a lookup table that copies and stores the results of extensive trimming tests and iterations. Instead of repeating the complex testing process during each power-on sequence, the system copies the optimal trimmings from the pre-computed lookup table, maintaining high reading accuracy while significantly reducing processing complexity.
Solution Approach 2:
The patent performs the complex iterative trimming selection and validation process as preliminary action during manufacturing. The results are cached in a lookup table, eliminating the need to repeat the complex processing during power-on initialization, thus reducing device complexity while maintaining manufacturing precision.
Data Source
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Figure 3A~3B
AI summary
A method (10a), comprising: selecting trimmings out of a set of candidate trimmings for analog blocks in a non-volatile memory, NVM, device and applying (104, 106) the selected trimmings to analog blocks in the non-volatile memory, NVM, device; performing (108) a reading operation of a fixed pattern using analog blocks in the non-volatile memory device having applied thereto (104; 106) the selected trimmings, obtaining a read pattern; checking (110) if the read pattern is equal to the fixed pattern; in response to the read pattern being equal to the fixed pattern, selecting (Y1) such selected trimmings as trimmings for application to the analog blocks; in response to the read pattern being not equal to the fixed pattern and in the presence of trimmings still to be selected (124; N3) in the set of candidate trimmings, selecting (122) out of the set of candidate trimmings a new set of trimmings and repeating with the new set of trimmings such performing (108), checking (110), and selecting (Y1; 122) in response to such checking (110); and in response to the read pattern being not equal to the fixed pattern and in the absence of trimmings still to be selected (124; Y3) in the set of candidate trimmings, indicating (126) a failure in selecting such trimmings for application to the analog blocks.