Parallel NVRAM Validation via PCI-e Extender

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Solution Overview

Problem

Existing methods for validating Nonvolatile Random-Access Memory (NVRAM) cards are serial and time-consuming, limiting the number of cards that can be validated in a given time period and restricting the production of computer systems incorporating these cards.

Innovation Solution

A system and method for parallel validation of NVRAM cards using a Peripheral Component Interconnect Express (PCI-e) expansion chassis and a custom PCI-e extender card to control hardware signals, allowing simultaneous testing of multiple cards, including writing data, verifying vault and restore operations, and programming firmware.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If serial validation methods are used for NVRAM cards, then the validation process is simple to implement, but the throughput of validated cards is low and the process is time-consuming

Engineering Contradiction:
Improvethroughput of validated NVRAM cardsVSAvoidcomplexity of validation system
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The validation system is segmented into multiple independent validation channels, each capable of testing one or more NVRAM cards simultaneously. The test harness includes multiple PCI-e slots and extender cards that can be configured to validate multiple cards in parallel, thereby increasing throughput without requiring each individual test component to be overly complex

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple NVRAM cards are merged into a single validation system through the use of a PCI-e expansion chassis with multiple slots. The system combines multiple cards into one test environment, allowing simultaneous validation of several cards through coordinated power cycling and data verification across all cards in the system

Inventive Principle:
Principle #5Merging (Combining)

2Productivity

If parallel validation of multiple NVRAM cards is implemented, then the throughput and efficiency are significantly increased, but the device complexity and hardware requirements increase

Engineering Contradiction:
Improvevalidation efficiencyVSAvoidhardware system complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The validation system is designed with universal components that can handle multiple NVRAM cards through standardized PCI-e interfaces. The test harness and extender cards provide multi-functional capabilities to manage power cycling, data writing, and verification across multiple cards simultaneously, reducing the need for card-specific validation hardware

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

A custom PCI-e extender card serves as an intermediary between the host system and multiple NVRAM cards. This intermediary component facilitates coordinated power management and signal distribution to multiple cards, enabling parallel validation while maintaining system manageability through a centralized control interface

Inventive Principle:
Principle #24Intermediary (Mediator)

3Loss of time

If multiple NVRAM cards are validated simultaneously, then the manufacturing time is reduced, but the control and verification of hardware signals becomes more difficult

Engineering Contradiction:
Improvemanufacturing validation timeVSAvoidhardware signal control difficulty
Core Design Contradiction:
Loss of timeVSDifficulty of detecting and measuring

Solution Approach 1:

The validation process employs periodic power cycling of the PCI-e slots and extender cards to systematically test each NVRAM card's power management functionality. By applying periodic power on and power off sequences to multiple cards in parallel, the system can verify that each card properly responds to power events while maintaining synchronized control through the shared PCI-e infrastructure

Inventive Principle:
Principle #19Periodic action

Data Source

PatentUS11763913B2Automated testing of functionality of multiple NVRAM cards
Publication Date: 2023.09.19 EMC IP HLDG CO LLC
  • US11763913B2 patent drawing
  • US11763913B2 patent drawing
  • US11763913B2 patent drawing

AI summary

A system can validate multiple nonvolatile random-access memory (NVRAM) devices in parallel. The system can concurrently write a first data to a first volatile memory of a first NVRAM device and a second NVRAM device. The system can modify a first electrical power source that provides an electrical power output that is received by the first NVRAM device and is received by the second NVRAM device to modify a voltage of the electrical power from a first value to a second value to initiate the first NVRAM device and the second NVRAM device to respectively perform a vault. The system can reset the first electrical power source, causing the first NVRAM device and the second NVRAM device to reset. The system can verify whether the first NVRAM device and the second NVRAM device respectively store the first data in volatile memory subsequent to performing the resetting.