Objective Lens Isolator for Probe System Noise Reduction
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Solution Overview
Problem
Probe systems face challenges in maintaining low noise conditions during device under test (DUT) testing due to electromagnetic interference (EMI) and radiation, which affects the accuracy of measurements.
Innovation Solution
The implementation of a probe system with an imaging device featuring an objective lens isolator and an electrical grounding assembly that restricts electromagnetic noise, including an objective lens grounding conductor to connect the imaging device objective lens to the enclosure and ground, thereby isolating it from the imaging device body and reducing noise propagation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the imaging device objective lens is electrically connected to the imaging device body, then the structural support and optical alignment are maintained, but electromagnetic noise propagates from the imaging device body to the objective lens and into the enclosure volume
Solution Approach 1:
The patent introduces an objective lens isolator as an intermediary component positioned between the imaging device body and the objective lens. This isolator serves as a mediator that breaks the direct electrical connection while maintaining optical alignment, thereby preventing electromagnetic noise propagation from the imaging device body to the objective lens and into the enclosure volume.
Solution Approach 2:
The patent segments the electrical connection path by inserting the objective lens isolator between the imaging device body and the objective lens. This segmentation divides the previously continuous electrical connection into separate sections, creating an electrical isolation barrier that prevents noise propagation while allowing optical signals to pass through.
2Measurement precision
If the imaging device body is positioned interior of the enclosure volume, then the optical imaging function is improved, but electromagnetic noise from the imaging device body interferes with the testing of devices under test
Solution Approach 1:
The objective lens isolator acts as a mediator that allows the imaging device body to be positioned interior of the enclosure volume for optimal optical imaging while preventing electromagnetic noise from reaching the devices under test. The isolator maintains the beneficial positioning while blocking the harmful electromagnetic interference.
3Object-affected harmful factors
If an electrical connection is maintained between the imaging device objective lens and the enclosure ground, then electromagnetic noise is restricted, but the objective lens isolator adds structural complexity
Solution Approach 1:
The objective lens isolator is designed to perform multiple functions simultaneously: it provides electrical isolation to restrict electromagnetic noise, maintains optical alignment between the imaging device body and objective lens, and serves as a structural support element. By combining these functions into a single component, the patent reduces overall structural complexity while achieving noise restriction.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration effectively minimizes electromagnetic noise within the enclosure volume, allowing for precise testing of DUTs by reducing interference and maintaining a low noise floor during the testing process.
Implementation Method 1
an objective lens isolator that at least partially electrically isolates the imaging device objective lens from the imaging device body
Implementation Method 2
an electrical grounding assembly configured to restrict electromagnetic noise from entering the enclosure volume
Implementation Method 3
an objective lens grounding conductor to connect the imaging device objective lens to the enclosure and ground
Data Source
AI summary
Probe systems including imaging devices with objective lens isolators and related methods are disclosed herein. A probe system includes an enclosure with an enclosure volume for enclosing a substrate that includes one or more devices under test (DUTs), a testing assembly, and an imaging device. The imaging device includes an imaging device objective lens, an imaging device body, and an objective lens isolator. In examples, the probe system includes an electrical grounding assembly configured to restrict electromagnetic noise from entering the enclosure volume. In examples, methods of preparing the imaging device include assembling the imaging device such that the imaging device objective lens is at least partially electrically isolated from the imaging device body. In some examples, utilizing the probe system includes testing the one or more DUTs while restricting electrical noise from propagating from the imaging device to the substrate.