OCT Fundus Layer Mapping for Wide-Field Thickness Accuracy

The patent applies local quality by specifying normal directions that are specific to each incident position on the fundus. Instead of using a uniform measurement approach across the entire wide field of view, the system determines local normal directions at different positions (central and peripheral regions) to account for the varying incident angles of measurement light. This allows accurate thickness measurements to be performed locally at each position while maintaining wide field of view coverage.

The patent applies preliminary action by determining the normal direction of the fundus surface at each incident position before performing thickness measurements. This preliminary determination of normal directions allows the subsequent thickness measurements to be performed along the correct directional axes, ensuring that measurements reflect actual fundus morphology rather than artifacts caused by incident angle variations. This preliminary step is integrated into the existing OCT processing workflow.