Optical Diffraction Tomography Microscope Without Rotating Illumination

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Solution Overview

Problem

Existing optical diffraction tomography microscopes are complex, costly, and time-consuming for observing biological samples, with limitations in resolution, image quality, and compatibility with multi-well plates, and they require mechanical rotating light transmitters.

Innovation Solution

An optical diffraction tomography microscope with a static illumination system using a wave collection system with an annular aperture and a common-path detection system, generating a rotating sample illumination beam without mechanical rotation, and utilizing a lens with internal reflective surfaces and a beam splitter for high-resolution imaging of biological samples.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a mechanical rotating beam mechanism is used to achieve large numerical aperture for tomographic reconstruction, then image quality and resolution are improved, but device complexity and cost increase

Engineering Contradiction:
Improveimage qualityVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces the mechanical rotating beam mechanism with a static illumination system comprising multiple fixed light sources arranged in a circular array around the sample observation zone. These light sources emit beams at different inclination angles simultaneously, achieving the same tomographic reconstruction capability without mechanical rotation. This substitution eliminates the complexity of moving parts while maintaining the large numerical aperture needed for high-quality imaging.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The illumination system is segmented into multiple independent light sources (e.g., 4-8 sources) positioned at different angular locations around the sample. Each light source contributes to the numerical aperture from its specific angle, and their combined effect achieves the desired large numerical aperture without requiring a single complex rotating mechanism. The wave collection system similarly uses multiple fixed detectors arranged to collect scattered light from different angles.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If a mechanical rotating beam mechanism is used for tomographic reconstruction, then large numerical aperture is achieved, but manufacturing cost increases

Engineering Contradiction:
Improvenumerical apertureVSAvoidmanufacturing cost
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent replaces the expensive mechanical rotating beam mechanism with a static array of simple light sources and fixed wave collection elements. This substitution dramatically reduces manufacturing complexity and cost while maintaining the large numerical aperture capability. The static configuration eliminates the need for precision mechanical components, motors, and control systems required for rotation.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The illumination system uses multiple simple, inexpensive light sources (such as LEDs or laser diodes) arranged in a fixed circular array, replacing the need for a single complex, expensive rotating beam mechanism. These simple components are easier and cheaper to manufacture and replace if needed.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

3Measurement precision

If a mechanical rotating beam mechanism is used, then tomographic imaging capability is achieved, but observation speed of multiple samples decreases

Engineering Contradiction:
Improvetomographic imaging capabilityVSAvoidobservation speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The static illumination system with multiple light sources enables continuous simultaneous illumination from multiple angles, eliminating the time required for mechanical rotation between measurements. The wave collection system with multiple fixed detectors collects scattered light from all angles concurrently, allowing rapid acquisition of holographic data for multiple samples in parallel or quick succession.

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The system segments the illumination and detection functions into multiple independent channels (multiple light sources and multiple detectors), allowing parallel data acquisition from different angles. This parallelization significantly increases the observation speed compared to sequential angular scanning with a single rotating beam.

Inventive Principle:
Principle #1Segmentation

4Device complexity

If conventional microscopy is used, then simplicity is maintained, but resolution and image quality are limited

Engineering Contradiction:
ImprovesimplicityVSAvoidresolution
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent replaces conventional optical microscopy with digital holographic microscopy, which uses wave collection and numerical reconstruction instead of complex optical lenses and mirrors. This substitution achieves superior resolution and image quality while maintaining relative simplicity in the optical path, as the complex image processing is performed digitally rather than optically.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system uses dynamic light scattering measurement combined with numerical reconstruction algorithms to achieve high-resolution 3D tomographic images. The scattered light waves are captured and processed computationally to reconstruct the sample's refractive index distribution, providing dynamic imaging capability with high resolution without requiring complex mechanical or optical systems.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system provides high-quality, marker-free imaging of biological samples with rapid observation capabilities, supporting various container systems and reducing manufacturing and operational costs while maintaining high resolution and image quality.

Implementation Method 1

a wave collection system configured to collect sample illumination beams scattered by the sample illumination beam sources incident on the sample in the sample observation zone at a beam inclination angle with respect to a center axis extending through the sample observation zone, of between 10° and 85°

Methodology Applied
Scientific EffectLight scattering: Scattering

Implementation Method 2

the wave collection system comprises a lens with an annular aperture, the wave collection system configured to collect sample illumination beams emitted by the sample illumination beam sources

Methodology Applied
Scientific EffectOptical focusing: Lens

Implementation Method 3

an illumination system configured for transmitting a sample beam through a sample observation zone

Methodology Applied
Scientific EffectCoherent light transmission: Coherent Light

Implementation Method 4

a detection system comprising at least one image sensor

Methodology Applied
Scientific EffectOptical detection: Photoelectric Effect

Data Source

PatentEP4260113B1Optical diffraction tomography microscope
Publication Date: 2026.02.25 NANOLIVE SA
  • EP4260113B1 patent drawingFigure 1a~1c
  • EP4260113B1 patent drawingFigure 2a~3
  • EP4260113B1 patent drawingFigure 4~5

AI summary

34 P2418PC00 Abstract Optical diffraction tomography microscope (2) comprising an illumination system (4) configured for transmitting a sample beam through a sample observation zone, a detection5 system (8) comprising at least one image sensor (54), and a wave collection system (6) comprising a lens (16) downstream of the sample observation zone configured for directing the sample beam towards the at least one image sensor. [Fig. 12a]10