Offset Curved Testing Tip for Probe Head Contact Stability
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Solution Overview
Problem
Conventional probe heads face limitations in structural changes and conductive probe design, particularly with testing tips being centered and formed only by planes, which restricts their effectiveness in integrated circuit testing.
Innovation Solution
The design includes a probe head with conductive probes featuring a middle segment, upper and lower connecting segments, and offset testing tips with a curved surface, allowing for better support and improved contact with integrated circuit components, along with a thin metal film to prevent damage and oxidation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the testing tip is arranged at the center position and formed only by planes, then the structure is simple and easy to manufacture, but the supporting effect and contact stability with IC components are insufficient
Solution Approach 1:
The patent applies asymmetry by offsetting the testing tip from the central axis of the conductive probe. The testing tip is positioned at a distance from the central axis, creating an asymmetric structure that improves contact stability with IC components. This asymmetric arrangement allows the testing tip to better engage with the target surface while maintaining structural simplicity.
Solution Approach 2:
The patent implements curvature by forming the testing tip with a curved surface instead of a flat plane. The curved surface of the testing tip provides better supporting effect and contact stability with IC components compared to a planar surface. This curvature allows for more effective force distribution and improved mechanical contact.
2Reliability
If conventional probe head structure is maintained, then manufacturing and assembly are straightforward, but further improvement in testing effectiveness is difficult
Solution Approach 1:
The patent applies local quality by differentiating the structure of various segments of the conductive probe. The testing tip portion has a curved surface and offset positioning for optimal contact, while the connecting segments have different geometries for electrical connection and mechanical support. This localized optimization improves testing effectiveness without requiring complete structural redesign.
Solution Approach 2:
The patent divides the conductive probe into multiple segments: a testing tip segment with curved surface, connecting segments with different geometries, and contact segments. This segmentation allows each part to be optimized for its specific function while maintaining overall structural simplicity and ease of manufacture.
3Reliability
If the testing tip has offset with respect to central axis and curved surface, then the supporting effect and contact stability are improved, but manufacturing precision requirements increase
Solution Approach 1:
The patent incorporates preliminary action by pre-positioning the testing tip at an offset location from the central axis during probe fabrication. The testing tip is formed with a specific offset distance and curved surface geometry in advance, which simplifies the assembly process and reduces the need for complex post-adjustment procedures. This pre-positioning ensures consistent contact stability while managing manufacturing precision requirements.
Data Source
AI summary
A probe head and a conductive probe thereof are provided. The conductive probe has a first long lateral edge and a second long lateral edge which define a central axis there-between. The conductive probe includes a middle segment, an upper connecting segment and a lower connecting segment respectively extending from the middle segment in two opposite directions, and an upper contacting segment and a lower contacting segment respectively extending from the upper and the lower connecting segments in two opposite directions. The lower contacting segment includes a testing tip having an offset with respect to the central axis and a curved surface connecting the testing tip and the second long lateral edge. A first distance between the testing tip and the first long lateral edge is less than a second distance between the testing tip and the second long lateral edge.