Dual Offset Cameras for Automatic Microscope Focus

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Solution Overview

Problem

Current microscope focus systems require multiple images and adjustments to determine the in-focus position, increasing microscopic scan time due to the need for sharpness measurements that do not indicate the direction of adjustment, and are inefficient in high-throughput scanning applications.

Innovation Solution

The system employs two offset focusing cameras positioned on either side of a focusing conjugate plane, with offset distances set to ensure equal sharpness measurements, allowing the hardware processor to determine focus when the sharpness values from both cameras are equal, thereby reducing the number of images and adjustments needed.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple images and adjustments are used to determine in-focus position, then measurement precision is improved, but loss of time increases

Engineering Contradiction:
Improvefocus determination accuracyVSAvoidmicroscopic scan time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent divides the focus measurement function into two separate cameras positioned at different locations. Each camera independently measures sharpness, and their measurements are combined to determine both the in-focus position and the direction of adjustment. This segmentation allows simultaneous acquisition of multiple measurement data points, reducing the number of sequential adjustments needed while maintaining precision.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system performs preliminary positioning using the two-camera setup to quickly identify the region containing the in-focus position. By capturing images from two different locations simultaneously and comparing sharpness measurements, the system preliminarily determines which direction leads to better focus, eliminating the need for exhaustive sequential searching and significantly reducing total focus time.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If sharpness measurements are taken at multiple Z positions, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvefocus position accuracyVSAvoidsystem configuration
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Instead of increasing the number of Z-position measurements, the patent introduces a spatial dimension by placing two cameras at different lateral positions. This dimensional change allows the system to obtain multiple sharpness measurements simultaneously at the same Z position, achieving the precision benefit without the complexity of multiple Z-position adjustments and image captures.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Ease of operation

If traditional sharpness measurement methods are used, then ease of operation is maintained, but productivity decreases

Engineering Contradiction:
Improveoperation simplicityVSAvoidthroughput in high-speed scanning
Core Design Contradiction:
Ease of operationVSProductivity

Solution Approach 1:

The system implements a feedback mechanism where the two cameras continuously monitor sharpness measurements and provide real-time information about focus quality and adjustment direction. This feedback allows the control system to make informed, rapid adjustments without requiring complex manual operations, thereby maintaining ease of operation while dramatically increasing throughput by reducing the number of adjustment cycles needed.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS11796785B2Systems, devices and methods for automatic microscope focus
Publication Date: 2023.10.24 NANOTRONICS IMAGING INC
  • US11796785B2 patent drawing
  • US11796785B2 patent drawing
  • US11796785B2 patent drawing

AI summary

An automatic focus system for an optical microscope that facilitates faster focusing by using at least two offset focusing cameras. Each offset focusing camera can be positioned on a different side of an image forming conjugate plane so that their sharpness curves intersect at the image forming conjugate plane. Focus of a specimen can be adjusted by using sharpness values determined from images taken by the offset focusing cameras.