Offset Slit Resonator for Uniform Plasma Deposition

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Solution Overview

Problem

The plasma chemical vapor deposition process results in non-uniform thickness and refractive index along the axial direction of the substrate tube due to microwave interaction with the metal shell, leading to poor fiber quality parameters such as attenuation and mode-field diameter uniformity, especially exacerbated by high deposition amounts, small diameters, high deposition rates, and high microwave power.

Innovation Solution

The slit configuration in the resonator is designed with sections offset in the cylindrical direction, allowing for a quarter of the plasma wavelength offset, which shifts the deposition thickness variation patterns when rotating the substrate tube, achieving balanced plasma configuration and reduced oscillatory behavior in deposition thickness and refractive index.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a single continuous slit configuration is used in the resonator, then the structure is simple and easy to manufacture, but non-uniform deposition thickness and refractive index occur along the axial direction due to microwave interaction with the metal shell

Engineering Contradiction:
Improveslit configuration structureVSAvoiddeposition thickness uniformity
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The continuous slit configuration is divided into multiple discrete slit sections that are mutually offset in the cylindrical direction. This segmentation allows each section to contribute to deposition at different circumferential positions, and when the substrate tube rotates, the patterns interchange to average out the non-uniformities, significantly reducing oscillatory behavior in deposition thickness and refractive index

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The slit sections are deliberately positioned asymmetrically with mutual offset in the cylindrical direction (preferably around a quarter of the plasma wavelength). This asymmetric arrangement ensures that the deposition patterns from different slit sections do not align, and upon rotation of the substrate tube, the patterns interleave to produce more uniform overall deposition

Inventive Principle:
Principle #4Asymmetry

2Quantity of substance

If the amount of deposited glass is increased to meet fiber requirements, then the fiber performance improves, but the non-uniformity in deposition thickness increases due to cumulative microwave interaction effects

Engineering Contradiction:
Improveamount of deposited glassVSAvoiddeposition thickness uniformity
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

By using multiple offset slit sections, the deposition process accumulates material from different circumferential positions rather than from a single continuous source. This segmentation prevents the cumulative microwave interaction effects that occur with large deposition amounts in conventional single-slit configurations, maintaining uniformity even as total deposited glass increases

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The substrate tube is rotated during the deposition process, creating periodic interchange of the deposition patterns from different slit sections. This periodic rotation ensures that each location on the substrate receives material from multiple slit sections over time, averaging out the non-uniformities and enabling larger deposition amounts with maintained uniformity

Inventive Principle:
Principle #19Periodic action

3Productivity

If microwave power is increased to achieve high deposition rates, then productivity improves, but non-uniform deposition and reflections at the ends of the substrate tube worsen

Engineering Contradiction:
Improvedeposition rateVSAvoiddeposition thickness uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The multiple offset slit sections distribute the microwave power interaction across different circumferential positions, preventing the formation of strong standing wave patterns and reflections that occur with high power in single-slit configurations. This allows high deposition rates to be achieved while maintaining uniformity

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The offset slit sections act as intermediaries that distribute and diffuse the microwave energy interaction along the substrate tube. By spacing the slit sections apart and offsetting them circumferentially, the direct microwave paths are interrupted, reducing reflections at the ends of the substrate tube while maintaining high overall power transfer for fast deposition

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach significantly improves the uniformity of fiber quality parameters like attenuation and mode-field width, reducing oscillatory behavior and enhancing the uniformity of deposited layers, resulting in improved fiber performance.

Implementation Method 1

the resonator is fed by a microwave source (typically a magnetron)... the microwave power creates a plasma which activates a reaction resulting in deposition of thin quartz layers

Methodology Applied
Scientific EffectMicrowave plasma generation: Plasma

Implementation Method 2

the resonator is fed by a microwave source

Methodology Applied
Scientific EffectElectromagnetic radiation: Microwave Radiation

Implementation Method 3

the resonator moves back and forth in the axial direction of the substrate tube

Methodology Applied
Scientific EffectMechanical motion:

Implementation Method 4

When rotating the substrate tube, e.g. stepwise, the patterns are repeatedly interchanged

Methodology Applied
Scientific EffectRotational motion:

Data Source

PatentEP2605267B1An apparatus for performing a plasma chemical vapour deposition process
Publication Date: 2018.02.21 DRAKA COMTEQ BV
  • EP2605267B1 patent drawingFigure 1~2A
  • EP2605267B1 patent drawingFigure 2B~2C
  • EP2605267B1 patent drawingFigure 3A~3B

AI summary

The invention relates to an apparatus for performing a plasma chemical vapour deposition process. The apparatus comprises a mainly cylindrical resonator being provided with an outer cylindrical wall enclosing a resonant cavity extending in a circumferential direction around a cylindrical axis. The resonator is further provided with side wall portions bounding the resonant cavity in the cylindrical direction, and with a slit configuration extending in a circumferential direction around the cylindrical axis providing access from the resonant cavity radially inwardly. Further, the slit configuration includes slit sections that are mutually offset in the cylindrical direction.