Offset Dual-Energy X-Ray Detector for Higher Spatial Resolution

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Solution Overview

Problem

Dual-energy X-ray detectors require twice the number of detector elements for desired spatial resolution, leading to increased system costs and degraded signal-to-noise ratio, and reducing transport speed or increasing readout frequency worsens throughput or signal-to-noise ratio.

Innovation Solution

A dual-energy X-ray detector with offset detector elements, allowing for higher spatial resolution without increasing the number of detector elements, achieved through geometric alignment and virtual data calculation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the number of detector elements is increased to achieve higher spatial resolution, then spatial resolution is improved, but system cost increases and signal-to-noise ratio deteriorates

Engineering Contradiction:
Improvespatial resolutionVSAvoidsignal-to-noise ratio
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent applies dimensionality change by arranging detector elements in three-dimensional space with offset positions between first and second detector lines. This spatial arrangement allows the same number of detector elements to cover an effective area equivalent to twice the number of elements in a conventional planar arrangement, thereby achieving doubled spatial resolution without increasing element count or degrading signal-to-noise ratio.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If the transport speed is reduced to achieve higher spatial resolution, then spatial resolution is improved, but throughput decreases

Engineering Contradiction:
Improvespatial resolutionVSAvoidthroughput
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

By utilizing three-dimensional offset arrangement of detector elements, the patent achieves higher spatial resolution through geometric configuration rather than through reducing transport speed. This allows the inspection object to be transported at normal speeds while still achieving doubled spatial resolution, thereby maintaining high throughput.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Measurement precision

If the readout frequency is increased to achieve higher spatial resolution, then spatial resolution is improved, but signal-to-noise ratio deteriorates

Engineering Contradiction:
Improvespatial resolutionVSAvoidsignal-to-noise ratio
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent achieves higher spatial resolution through spatial arrangement of detector elements in three dimensions rather than through increasing readout frequency. This geometric approach maintains adequate integration time for each detector element, preserving signal-to-noise ratio while achieving doubled spatial resolution through the offset configuration.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances spatial resolution in X-ray images without additional hardware costs, maintaining or improving throughput and signal-to-noise ratio.

Implementation Method 1

dual-energy X-ray radiography

Methodology Applied
Scientific EffectX-ray detection: X-Ray

Implementation Method 2

detector elements configured to respond differently spectrally selectively to a spectrum of X-rays

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS12498334B2Dual energy detector and methods for processing detector data
Publication Date: 2025.12.16 SMITHS DETECTION GERMANY GMBH
  • US12498334B2 patent drawing
  • US12498334B2 patent drawing
  • US12498334B2 patent drawing

AI summary

Disclosed is a dual-energy X-ray detector having a first detector line with first detector elements and a second detector line with second detector elements arranged parallel thereto, the detector lines being arranged parallel to one another in the line direction and being arranged one behind the other in the direction of the X-ray beams to be detected in such a manner that the projection of the first and the second detector lines in the direction of one of the X-ray beams to be detected, which passes through the surface center of gravity of a reference detector element of the first or the second detector line, are overlappingly offset from each other by an effective offset (Δx; Δy). Further disclosed is an X-ray inspection apparatus including such a detector and methods for processing detector data provided by means of the detector.