OLED Array Test Device Electron Beam Calibration
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Solution Overview
Problem
Existing organic light emitting diode (OLED) display manufacturing processes lack an efficient method to test and ensure the normal operation of transistors in pixel circuits, leading to potential defects and reduced yield due to the difficulty in accurately measuring the operational state of transistors without causing damage and noise from electron beam irradiation.
Innovation Solution
A method and device using an array test device with an electron beam irradiator, signal analyzer, and controller to calibrate and test the operational state of transistors by irradiating electron beams to capacitors and anodes, comparing output voltages, and determining abnormal pixels, thereby minimizing damage and noise, and ensuring accurate measurement of transistor operation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If electron beams are irradiated to test transistor operation, then measurement capability is improved, but damage and noise increase
Solution Approach 1:
The patent uses capacitors as intermediary elements to store test voltages and enables non-destructive reading of these stored voltages through secondary electron emission. The capacitor acts as a buffer between the test signal and the measurement process, allowing accurate transistor operation testing without direct electron beam damage to the transistor itself.
Solution Approach 2:
The patent replaces direct electron beam measurement of transistor operation with an electromagnetic field-based indirect measurement system. By using capacitors to store voltage information and detecting secondary electrons emitted from the capacitor electrodes, the system substitutes direct mechanical/electrical probing with field-based detection, reducing physical damage and noise.
2Measurement precision
If comprehensive testing is performed on all pixels, then measurement accuracy is improved, but manufacturing time increases
Solution Approach 1:
The patent performs preliminary testing on pixel circuits during the array fabrication process before final OLED assembly. By implementing transistor operation tests and pixel verification at this intermediate stage, defective pixels can be identified and repaired early, preventing waste of time and resources in subsequent manufacturing steps while maintaining comprehensive quality coverage.
Solution Approach 2:
The patent divides the testing process into segmented stages: first testing transistor operation individually using capacitor voltage storage, then performing comprehensive pixel-level verification. This segmentation allows efficient resource allocation, where critical transistor functionality is verified quickly on all pixels, and detailed pixel testing is performed selectively, reducing overall manufacturing time while maintaining measurement accuracy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method effectively increases production yield by preemptively identifying and repairing operational issues in pixel arrays, reducing manufacturing time and costs, and ensuring the quality and reliability of OLED displays by accurately testing transistor functionality.
Implementation Method 1
calibrating the control device of the array test device based on secondary electrons output by the capacitor; secondarily irradiating electron beams to an anode of the pixel circuit; and detecting whether the first transistor is normally operated from an output amount of the secondary electrons output by the anode
Data Source
AI summary
A method for testing an array for a pixel circuit of an organic light emitting diode display, which includes a first transistor that transmits a driving current corresponding to a data signal to an organic light emitting diode according to a scan signal and at least one capacitor, uses an array test device having a control device and a driver. The method includes performing a first irradiation of electron beams to an exposed portion of a first electrode of the at least one capacitor before manufacturing of the organic light emitting diode is completed, calibrating the control device of the array test device based on secondary electrons output by the at least one capacitor, performing a second irradiation of electron beams to an anode of the pixel circuit, and detecting whether the first transistor is normally operated based on an output amount of secondary electrons output by the anode.