OLED Display Substrate Crack Detection via Switching Transistor Segmentation
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Solution Overview
Problem
Current OLED flexible products face challenges in crack detection due to insufficient data voltage writing caused by the resistance of crack detecting wires, leading to inaccurate or excessive testing during Cell Test, affecting product quality and yield.
Innovation Solution
A display substrate design with a non-display area containing switching transistors and a crack detecting wire that operates in different voltage regions to detect defects, allowing the switching transistor to either shield or amplify changes in resistance, ensuring accurate crack detection without affecting undesirable-display detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a metal wire is provided to surround the display panel for crack detection, then crack detection capability is improved, but data voltage writing becomes insufficient due to wire resistance
Solution Approach 1:
The patent divides the crack detection function from the data writing function by introducing a separate switching transistor for each crack detecting wire. This segmentation allows independent control of the crack detecting wire resistance, preventing it from interfering with data voltage writing accuracy while maintaining crack detection capability.
Solution Approach 2:
The patent dynamically controls the resistance of crack detecting wires by using switching transistors that can adjust the wires between conductive and high-resistance states. This dynamic adjustment ensures that during data writing, the crack detecting wires do not interfere with voltage accuracy, while during crack detection, they can be activated without affecting normal display operation.
2Measurement precision
If the crack detecting wire resistance increases when cracked, then crack detection is enabled, but data voltage writing becomes insufficient causing bright lines in display
Solution Approach 1:
The patent performs crack detection before final product shipping by using a switching transistor to temporarily activate the crack detecting wire for resistance measurement. This preliminary action allows crack detection without leaving permanent high-resistance structures that would cause display defects during normal operation.
Solution Approach 2:
The switching transistor acts as an intermediary between the crack detecting wire and the data line. It isolates the high-resistance crack detecting wire from the data writing path during normal operation, preventing the wire's resistance from causing insufficient voltage writing and subsequent bright lines in the display.
3Measurement precision
If switching transistor is added to control crack detecting wire, then crack detection accuracy is improved, but device complexity increases
Solution Approach 1:
The switching transistor serves multiple functions: it controls the crack detecting wire during crack detection, isolates the wire during data writing, and prevents interference with display operation. This multi-functionality reduces the need for additional separate components, thereby limiting the increase in device complexity while achieving accurate crack detection.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design enables precise crack detection without interfering with undesirable-display detection, improving the accuracy and reducing misjudgment in the testing process, thus enhancing product quality and yield.
Implementation Method 1
In a case where the crack detecting wire breaks, a resistance of the crack detecting wire increases
Implementation Method 2
the switching transistor operates in a linear region... the switching transistor operates in a saturation region
Data Source
AI summary
Provided are a display substrate, a method for detecting the same and a display device. The display substrate includes a display area and a non-display area surrounding the display area, the display substrate further includes data lines extending from the display area to the non-display area, the non-display area is provided with at least one switching transistor, a first electrode of each switching transistor is coupled to one of the data lines, a second electrode of each switching transistor is coupled to a data voltage supply circuit, at least one crack detecting wire, corresponding to the at least one switching transistor in one-to-one correspondence, is provided in the display area, an end of the crack detecting wire is coupled to a control electrode of the switching transistor corresponding to the crack detecting wire, another end of the crack detecting wire is coupled to a switching voltage supply circuit.