OLED Display Panel Array Test Assembly Multiplexer
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Solution Overview
Problem
In the manufacturing of OLED display panels, existing methods face challenges in efficiently testing the electrical properties of semi-finished products before the installation of integrated circuit devices, particularly in narrow-frame designs where direct access to the TFT array through cables is restricted, hindering the detection of defects such as open or short circuits during the array test (AT test).
Innovation Solution
The implementation of a display substrate with an array test assembly that includes a multiplexer structure between first and second pads, allowing for test signals to be input to sub-pixel units via third pads, which are electrically coupled to the data transmission lines, enabling effective testing without additional wiring area and ensuring the multiplexers are turned off during normal operation to prevent interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If direct cable access to TFT array is used for testing, then testing simplicity is improved, but narrow-frame design restricts access and makes testing difficult
Solution Approach 1:
The patent introduces an array test assembly as an intermediary component between the test cables and the TFT array. This assembly includes test signal input terminals that receive test signals and transmit them to the TFT array through data transmission lines, effectively mediating the connection in narrow-frame designs where direct cable access is restricted.
Solution Approach 2:
The patent changes the testing approach from direct physical access to the TFT array to indirect access through data transmission lines. By utilizing the existing data transmission line infrastructure and introducing an array test assembly that interfaces with these lines, the patent enables testing through a different dimensional pathway without requiring direct cable access to the array.
2Difficulty of detecting and measuring
If array test assembly is added to enable testing in narrow-frame designs, then testing accessibility is improved, but device complexity increases
Solution Approach 1:
The patent merges the array test assembly with the existing data transmission line structure. The test signal input terminals of the array test assembly are electrically connected to the data transmission lines, allowing the testing function to be integrated into the existing wiring infrastructure rather than requiring completely separate test pathways.
Solution Approach 2:
The array test assembly serves multiple functions: it receives test signals from external cables, transmits them through the data transmission lines to the TFT array, and enables electrical property testing without interfering with normal display operations when properly controlled. This multi-functionality reduces the need for entirely separate dedicated test infrastructure.
3Area of stationary object
If multiplexer is used to share data transmission lines for testing, then wiring area is reduced, but device complexity increases
Solution Approach 1:
The patent merges the testing function with the existing data transmission lines through the array test assembly, allowing the same physical lines to serve both display data transmission and testing purposes. This sharing of infrastructure reduces the need for additional dedicated test wiring.
Solution Approach 2:
The system dynamically switches between testing mode and normal display operation mode. During testing, the array test assembly actively transmits test signals; during normal operation, the system returns to standard display data transmission. This dynamic switching allows the same infrastructure to serve multiple purposes at different times.
4Measurement precision
If test signals are transmitted through data transmission lines, then testing effectiveness is improved, but interference with normal operation may occur
Solution Approach 1:
The patent implements periodic action by enabling testing only during specific testing phases and returning to normal display operation during regular use. The array test assembly is activated periodically for testing purposes and deactivated during normal operation, ensuring that test signals do not continuously interfere with display functionality.
Solution Approach 2:
The array test assembly acts as a mediator that isolates test signals from the main display data pathway. By providing a dedicated interface for test signal injection and control, it prevents test signals from directly interfering with normal display data transmission, maintaining operational reliability while enabling effective testing.
Data Source
AI summary
A display substrate and a display apparatus are provided, the display substrate includes: a base substrate including a display area and a peripheral area surrounding the display area; a plurality of sub-pixel units in the display area; a plurality of data lines in the display area and electrically coupled to the plurality of sub-pixel units; a plurality of data transmission lines in the peripheral area on at least one side of the display area and electrically coupled to the plurality of data lines; a plurality of first pads and a plurality of second pads located between the plurality of first pads and the plurality of data transmission lines; a plurality of third pads between the plurality of first pads and the plurality of second pads; and a plurality of multiplexers between the plurality of second pads and the plurality of third pads.