OLED Display Panel Sub-Pixel Defect Detection via Segmented Lines
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Solution Overview
Problem
Existing OLED display panels lack an effective method to detect operational characteristics and parameters of sub-pixel devices, which affects light-emitting performance and display quality.
Innovation Solution
A display panel design that includes a display region with sub-pixels and first detection lines, where at least one sub-pixel contains a to-be-tested device electrically connected to the detection line. The non-display region includes detection pads connected to these detection lines, allowing for the determination of current signals and detection of defects in sub-pixel devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If no detection structure is added to the display panel, then the manufacturing process remains simple, but the ability to detect defects in sub-pixel devices is lost
Solution Approach 1:
The detection function is segmented from the main display function by creating separate detection lines and detection pads that are independent of the pixel circuits. This allows defect detection without interfering with the normal display operation, resolving the contradiction between adding detection capability and maintaining device simplicity.
Solution Approach 2:
Detection lines serve as intermediary elements that connect the to-be-tested devices in sub-pixels to the detection pads outside the display region. These intermediaries enable signal transmission for defect detection without requiring direct access to the pixel circuits, thus adding detection capability while minimizing structural complexity.
2Reliability
If detection lines and detection pads are added to enable defect detection, then product quality can be improved, but the manufacturing process becomes more complex
Solution Approach 1:
The detection lines are merged with the existing pixel circuit layout by routing them through available space without requiring separate fabrication layers. The detection pads are combined with the existing pad structure in the non-display region. This merging approach enables defect detection functionality while using the same manufacturing processes as the original display panel.
Solution Approach 2:
The detection lines serve multiple functions: they act as signal transmission paths for both the display function and the defect detection function. Similarly, the detection pads can serve as both display signal interfaces and defect detection interfaces. This multi-functionality reduces the need for additional dedicated structures, simplifying the manufacturing process while maintaining reliability.
3Measurement precision
If a complex detection system is implemented, then defect detection accuracy improves, but production costs increase
Solution Approach 1:
The detection system uses the existing signal transmission paths (data lines, signal lines, and pixel circuits) to carry detection signals. The pixel circuits themselves are utilized to generate and transmit test signals through the detection lines to the detection pads. This self-service approach eliminates the need for separate dedicated test signal generation circuits, reducing material costs while maintaining detection accuracy.
Solution Approach 2:
The detection structure replicates the signal transmission architecture of the display function, using similar line structures and connection methods. By copying the proven manufacturing approach used for display signal routing, the detection system can be manufactured using the same processes and materials, avoiding additional production costs while achieving accurate defect detection.
Data Source
AI summary
A display panel, a detection method of a display panel, and a display device are provided. The display panel includes a display region and a non-display region surrounding the display region. The display region includes a plurality of sub-pixels and at least one first detection line. At least one sub-pixel of the plurality of sub-pixels includes at least one to-be-tested device, and the at least one to-be-tested device is electrically connected to the at least one first detection line. The non-display region includes at least one detection pad, and a detection pad of the at least one detection pad is electrically connected to a first detection line of the at least one first detection line.