OLED Dummy Pixel for Semiconductor Width Uniformity
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Solution Overview
Problem
High-resolution organic light emitting diode (OLED) displays face issues with bright spots due to the loading effect, which causes the semiconductor width to thin at the outermost pixels, leading to reduced wiring density and display quality.
Innovation Solution
Incorporating a dummy pixel with a dummy semiconductor at the outermost portion of the OLED display, which matches the semiconductor density of central pixels, thereby alleviating the loading effect and preventing semiconductor thinning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the pixel size is reduced to achieve higher resolution, then the display resolution is improved, but the semiconductor width becomes thin due to the loading effect, causing bright spots
Solution Approach 1:
The patent applies preliminary action by forming a dummy semiconductor pattern adjacent to the outermost pixel's semiconductor pattern before the photolithography process. This dummy pattern pre-establishes the necessary developer distribution conditions, preventing the loading effect from causing semiconductor width thinning in the outermost pixels during subsequent processing steps.
Solution Approach 2:
The dummy semiconductor pattern acts as an intermediary element that mediates between the photolithography process and the outermost pixel semiconductor. By introducing this intermediate structure, the patent equalizes the developer usage across all pixels, including outermost ones, thereby preventing the loading effect without requiring changes to the core pixel structure or photolithography parameters.
2Ease of manufacture
If the developer amount per unit area varies at outermost pixels, then the photolithography process is simplified, but the semiconductor width becomes thin due to the loading effect
Solution Approach 1:
The patent applies local quality by introducing a dummy semiconductor pattern specifically at the outermost pixel locations, while leaving the central pixels unchanged. This localized modification creates different structural conditions only where needed (at the boundaries), equalizing the developer distribution and preventing the loading effect without complicating the overall photolithography process for the entire pixel array.
3Quantity of substance
If the semiconductor width is reduced, then the pixel density increases, but bright spots occur due to the loading effect
Solution Approach 1:
By forming the dummy semiconductor pattern in advance before photolithography, the patent preliminarily establishes the correct developer distribution conditions. This allows the outermost pixels to maintain proper semiconductor width even when pixel density is increased, preventing bright spots from occurring despite the higher density and reduced semiconductor dimensions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Prevents bright spots from occurring at the outermost pixels, maintaining consistent semiconductor density and improving display quality by equalizing the developer usage per unit area across the pixel array.
Implementation Method 1
The OLD forms excitons by combining electrons injected from a cathode which is one electrode with holes injected from an anode which is another electrode at the organic emission layer, and emits light by allowing the excitons to emit energy.
Data Source
AI summary
An organic light emitting diode display including: a substrate including a pixel part for displaying an image and a peripheral part enclosing the pixel part; a plurality of scan lines formed on the substrate, each for transferring a scan signal; a plurality of data lines for transferring a data voltage, and a plurality of driving voltage lines intersecting the plurality of scan lines for transferring a driving voltage, respectively; a plurality of pixels connected to the plurality of scan lines and the plurality of data lines, respectively and formed in the pixel part; and at least one dummy pixel connected to the plurality of scan lines and the plurality of data lines and formed in the peripheral part.