OLED Display Encapsulation with Impurity Extraction Holes
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Solution Overview
Problem
Display apparatuses, particularly those using OLEDs, are prone to defects due to moisture and oxygen impurities, leading to reduced lifespan and difficulty in detecting manufacturing defects during the production process.
Innovation Solution
The display apparatus incorporates a substrate with specific geometric features such as through holes, grooves, and test concave portions, along with an insulating layer and oxygen/moisture-permeable material layers, to reduce defect occurrence and facilitate quick defect detection during manufacturing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If OLED materials are used in display apparatus, then display quality and color performance are improved, but the apparatus deteriorates quickly due to moisture and oxygen impurities
Solution Approach 1:
The encapsulation structure is segmented into multiple functional layers: substrate, insulating layer with through-holes, oxygen barrier layer, and moisture barrier layer. Each layer performs a specific protective function, creating a hierarchical defense system against impurities that extends the lifespan of OLED materials while maintaining display quality.
Solution Approach 2:
The insulating layer with controlled through-holes acts as an intermediary structure between the substrate and barrier layers. This intermediary enables selective impurity removal while maintaining the protective function of the encapsulation, resolving the contradiction between display quality and reliability.
2Ease of manufacture
If traditional encapsulation structures are used, then manufacturing is simple, but defect detection during manufacturing is difficult
Solution Approach 1:
Test concave portions are formed in the substrate before final encapsulation completion. This preliminary action creates accessible test regions that enable defect detection during manufacturing processes, solving the contradiction between manufacturing simplicity and defect detectability.
Solution Approach 2:
The encapsulation structure itself provides test access through the concave portions and through-hole configurations. The structure serves both protective and testing functions, enabling self-diagnosis of manufacturing defects without additional complex testing equipment.
3Productivity
If impurities are not removed during manufacturing, then manufacturing process is fast, but defects occur during use
Solution Approach 1:
The through-holes in the insulating layer provide extraction pathways for impurities to be removed from the encapsulation structure during manufacturing. This extraction mechanism allows fast manufacturing processes while ensuring impurity removal, preventing defects during use.
Solution Approach 2:
The insulating layer is designed with a porous structure containing through-holes that facilitate impurity removal. This porous design enables rapid manufacturing by allowing impurities to be extracted during production, while the subsequent barrier layers ensure long-term reliability by preventing impurity ingress.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design effectively prevents defects by isolating impurities and allows for efficient detection of manufacturing defects, thereby extending the lifespan of the display apparatus.
Implementation Method 1
an oxygen barrier layer on the substrate, the oxygen barrier layer including defined therein a main oxygen barrier through hole extended through a thickness of the oxygen barrier layer... and a moisture barrier layer on the substrate, the moisture barrier layer including defined therein a main moisture barrier through hole extended through a thickness of the moisture barrier layer
Data Source
AI summary
A display apparatus includes an insulating layer on a substrate, the substrate including a main through hole, a first groove around and outside the main through hole, and a first test concave portion outside the main through hole, and the insulating layer including a main insulating through hole connected to the main through hole, a first insulating through ring around and outside the main insulating through hole and connected to the first groove, and a first insulating through hole outside the main insulating through hole and connected to the first test concave portion. Along a same width direction: at a same position along the substrate, a width of the first insulating through ring of the insulating layer is less than a width of the first groove of the substrate, and a width of the first insulating through hole is less than a width of the first test concave portion.