OLED Inspection Circuit Prevents Cell Interference
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Solution Overview
Problem
Conventional OLED display inspection methods fail to prevent interference between cells and voltage drops during sheet inspection, and cannot accurately measure power consumption of the scan driver.
Innovation Solution
An OLED display with an integrated inspection circuit that includes a signal input section, signal receiving unit, and power supply management to generate and measure scan signals and power consumption, preventing interference and voltage drops by controlling signal phases and power supply lines.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If conventional inspection methods are used to inspect a sheet having a plurality of cells, then the inspection process can be performed, but interference between adjacent cells occurs and voltage drops are caused by leakage current
Solution Approach 1:
The patent divides the sheet into multiple independent inspection units, each with its own scan driver and inspection circuit. By segmenting the inspection process into cell-specific units with isolated power supply lines, the patent prevents interference between adjacent cells while maintaining comprehensive inspection capability across the entire sheet.
Solution Approach 2:
The patent applies different power supply conditions to different regions during inspection. Specifically, only the target cell receives power supply during inspection while other cells remain powered off, preventing leakage current and voltage drops in non-target areas. This local quality approach ensures that each cell is inspected under optimal conditions without affecting neighboring cells.
2Productivity
If conventional inspection methods are used, then inspection can be performed, but power consumption of the scan driver cannot be measured
Solution Approach 1:
The inspection circuit includes built-in power consumption measurement functionality that automatically measures the power consumption of the scan driver during the inspection process. The circuit uses the inspection signals already present in the system to drive the measurement, eliminating the need for separate measurement equipment and enabling accurate power consumption data collection while performing the inspection.
3Productivity
If multiple cells are inspected simultaneously, then inspection efficiency is improved, but interference between cells and voltage drops increase
Solution Approach 1:
The patent implements periodic inspection cycles where cells are inspected sequentially rather than simultaneously. The control unit activates power supply and performs inspection for one target cell at a time, then deactivates power supply before moving to the next cell. This periodic on-off cycling eliminates interference and voltage drops while maintaining efficient overall inspection throughput.
Data Source
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AI summary
An OLED display and a driving method of an inspection circuit are provided. The OLED display may include a data driver, a scan driver, a driving transistor, a switching transistor, an organic light emitting diode, and an inspection circuit. The data driver and scan driver may apply a data signal and a scan signal. The driving transistor may generate a current corresponding to a voltage supplied to a first electrode and a control electrode. The switching transistor may apply the data signal to the driving transistor. The organic light emitting diode may be electrically connected to the driving transistor. The inspection circuit may include a three-phase inverter circuit having an input and an output terminal. The input terminal may supply a first power voltage to the output terminal when the output terminal decides an output signal regardless of a signal input to the input terminal.