Organic Light Emitting Display Line Connecting Bridge

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Solution Overview

Problem

The complexity of fabricating organic light emitting display apparatuses is increased due to the need for multiple masks and layers, leading to increased defect rates and difficulty in forming low resistance wires for large screens, as data and scan lines must be disposed in separate layers to prevent electrical shorts.

Innovation Solution

The solution involves forming data and scan lines in the same layer with bridges that allow them to cross over each other, using an insulating layer and contact holes to connect them, thereby simplifying the fabrication process and reducing the number of masks required, while also enabling the formation of low resistance wires.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If data lines and scan lines are disposed in different layers separated by insulating layer, then electrical short between crossing lines is prevented, but fabrication process complexity increases due to additional masks and etching processes

Engineering Contradiction:
Improveprevention of electrical shortVSAvoidfabrication process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent transitions from a vertical stacking approach (different layers) to a planar approach with bridges (same layer), changing the dimensional arrangement of crossing lines to resolve the contradiction between preventing electrical shorts and simplifying fabrication processes

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent segments the continuous conductive lines by introducing bridge structures that allow data lines and scan lines to cross in the same layer without electrical connection, maintaining reliability while reducing fabrication complexity

Inventive Principle:
Principle #1Segmentation

2Reliability

If data lines and scan lines are disposed in different layers, then electrical insulation is achieved, but number of stacked layers increases leading to more fabrication processes

Engineering Contradiction:
Improveelectrical insulationVSAvoidfabrication efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent merges the data lines and scan lines into the same layer using bridge structures, reducing the total number of stacked layers and fabrication processes while maintaining electrical insulation through the bridge design

Inventive Principle:
Principle #5Merging (Combining)

3Area of stationary object

If substrate size is increased for large screen, then display area is improved, but wire resistance increases requiring thicker wires

Engineering Contradiction:
Improvedisplay areaVSAvoidwire resistance
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The patent changes the structural parameters of wire intersections by introducing bridge structures, which provide additional conduction paths and reduce effective resistance without requiring increased wire thickness, thus maintaining compatibility with large substrate sizes

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS8304987B2Organic light emitting display apparatus including a line connecting bridge and method of manufacturing the same
Publication Date: 2012.11.06 SAMSUNG DISPLAY CO LTD
  • US8304987B2 patent drawing
  • US8304987B2 patent drawing
  • US8304987B2 patent drawing

AI summary

An organic light emitting display apparatus and a method of fabricating the same are provided. The organic light emitting display apparatus includes a pixel unit on which an organic light emitting device is formed, a thin film transistor (TFT) electrically connected to the pixel unit and a data line and a scan line electrically connected to the TFT and disposed crossing each other on a substrate. The data line and the scan line are formed in one layer. A bridge that allows one of the data line and the scan line to bypass the other is on an intersection of the data line and the scan line.