OLED Gate-Line Overcurrent Feedback for Burnt Defect Isolation
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Solution Overview
Problem
Existing OLED displays face challenges in identifying the cause of defects, leading to inefficiencies in defect resolution due to the difficulty in distinguishing between power board, main board, and gate driving chip issues during burnt detection protection.
Innovation Solution
An OLED display with a current detection circuit that identifies overcurrent and generates feedback to turn off the display, simplifying the process of identifying module defects and improving development efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the BDP function is performed to prevent burnt elements, then element protection is improved, but the ability to identify defect causes deteriorates
Solution Approach 1:
The system performs preliminary actions by detecting overcurrent conditions and generating specific feedback signals before the burnt protection function fully activates. The timing controller detects overcurrent through feedback signals from the data driving unit and gate driving unit, and turns off the display in advance, preventing element damage while preserving defect location information through the feedback signal pattern.
Solution Approach 2:
The patent implements a feedback mechanism where the data driving unit and gate driving unit generate feedback signals indicating overcurrent conditions. The timing controller receives these feedback signals and uses them to determine which specific component (power board, main board, or gate driving chip) caused the defect, enabling both protection and defect identification.
2Reliability
If the display is turned off during BDP function, then element damage is prevented, but defect debugging time increases
Solution Approach 1:
The feedback signals generated by the data driving unit and gate driving unit provide immediate information about which component caused the overcurrent condition. This eliminates the need for time-consuming manual testing of each component, as the timing controller can directly identify the defective component based on the feedback signal pattern, significantly reducing defect resolution time.
Solution Approach 2:
The patent replaces manual mechanical testing procedures with an automated electrical feedback system. Instead of physically testing each component (power board, main board, gate driving chip) to identify defects, the system uses electrical feedback signals to automatically pinpoint the defective component, reducing debugging time from hours to seconds.
3Measurement precision
If multiple components are tested to identify defect causes, then accurate diagnosis is improved, but system complexity increases
Solution Approach 1:
The feedback mechanism serves multiple functions simultaneously: it detects overcurrent conditions, identifies the specific defective component (power board, main board, or gate driving chip), and triggers the appropriate protection response. This multi-functionality eliminates the need for separate testing circuits for each component, maintaining diagnostic accuracy while reducing overall system complexity.
Data Source
AI summary
An organic light emitting diode display according to an embodiment of the present disclosure may comprise: a display panel comprising a plurality of pixels; a gate driving part that drives a plurality of gate lines respectively connected to the plurality of pixels; a data driving part that drives a plurality of data lines respectively connected to the plurality of pixels; a current detection circuit that detects a current flowing through each of the gate lines and, when the detection current is overcurrent, generates feedback indicating the overcurrent; and a timing controller that turns off the power of the organic light emitting diode display in response to the feedback indicating the overcurrent.