OLED Pixel Circuit Layout for Defect Repair and Image Quality
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Solution Overview
Problem
Existing display devices face issues with high defect rates and image quality deterioration, particularly in organic light emitting diode (OLED) displays, which affect their performance and reliability.
Innovation Solution
The display device incorporates specific transistor configurations and connection modifications, including cut and connected data connection electrodes, and the use of light blocking layers and dummy electrodes to enhance pixel repair and maintain image quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional OLED display manufacturing is used, then production efficiency is maintained, but defect rate increases and image quality deteriorates
Solution Approach 1:
The display device is divided into multiple pixel units, each with independent transistor configurations ((1-1)th to (2-3)th transistors) and separate data connection electrodes. This segmentation allows defective pixels to be isolated and repaired independently without affecting the entire display, thereby reducing defect rates while maintaining production efficiency through modular manufacturing
Solution Approach 2:
The patent implements preliminary repair mechanisms by pre-configuring alternative data connection paths and dummy electrodes during manufacturing. When defects are detected, these pre-prepared structures enable immediate repair without requiring complete device disassembly or remanufacturing, thus improving reliability while preserving productivity
2Reliability
If pixel repair mechanisms are added, then image quality deteriorates less, but device complexity increases
Solution Approach 1:
The transistor configurations ((1-1)th to (2-3)th transistors) and data connection electrodes are designed with multi-functionality, serving both normal display operations and defect repair functions. The same structural elements perform dual roles, reducing the need for additional dedicated repair components and thereby limiting the increase in device complexity while improving image quality maintenance
3Reliability
If data connection electrodes are cut and reconnected, then defective pixels are repaired, but manufacturing precision requirements increase
Solution Approach 1:
Dummy electrodes serve as intermediary structures during the cutting and reconnection process of data connection electrodes. These intermediary elements provide alignment references and connection targets that simplify the precision requirements for electrode reconnection, enabling effective pixel repair without excessively increasing manufacturing precision demands
Data Source
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AI summary
The present disclosure relates to a display device, and more particularly, to a display device whose defect rate and image quality deterioration can be minimized and a method of fabricating the display device. According to an aspect of the present disclosure, there is provided a display device including: a first light emitting element; a (1-1)-th transistor including a drain electrode connected to a driving voltage line and a source electrode connected to a first anode of the first light emitting element; a (1-2)-th transistor including a gate electrode connected to a first scan line, a drain electrode connected to a first data line, and a source electrode connected to a gate electrode of the (1-1)-th transistor; a (1-3)-th transistor including a gate electrode connected to a second scan line, a drain electrode connected to the first anode of the first light emitting element, and a source electrode connected to an initialization voltage line; a second light emitting element; a (2-1)-th transistor including a drain electrode connected to a driving voltage line and a source electrode connected to a second anode of the second light emitting element; a (2-2)-th transistor including a gate electrode connected to the first scan line, a drain electrode connected to a second data line, and a source electrode connected to a gate electrode of the (2-1)-th transistor; a (2-3)-th transistor including a gate electrode connected to the second scan line, a drain electrode connected to the second anode of the second light emitting element, and a source electrode connected to the initialization voltage line; a first data connection electrode connected to the first data line and the drain electrode of the (1-2)-th transistor; and a second data connection electrode connected to the second data line and the drain electrode of the (2-2)-th transistor, wherein at least one of the drain electrode of the (1-2)-th transistor and the first data connection electrode is cut, the second data connection electrode is cut, and the second data connection electrode and the first data line are connected to each other.