OLED Repair via Test Pixels and Laser Ablation

The patent divides the detection and repair process into separate functional modules: test pixels are integrated at specific locations to detect short defects, while repair lines are provided as separate conductive paths that can be independently activated to repair defective areas. This segmentation allows the system to handle high-resolution displays with increased line density while maintaining reliable defect detection and repair capabilities through specialized components rather than relying on the fine-pitched lines alone.

The patent implements self-service through the integration of test pixels and repair lines that enable the display panel to detect and repair its own defects. The test pixels automatically identify short defects by emitting light when voltage short circuits occur, and the repair lines provide automated repair paths that can be activated without external intervention. This self-service mechanism significantly improves production yield by allowing defective panels to be repaired and reused, thereby reducing waste and increasing the number of usable displays from each mother substrate.

The test pixels serve multiple functions: they act as both display elements and defect detection sensors. When voltage short circuits occur at crossing points, the test pixels emit light to indicate the defect location, eliminating the need for separate detection hardware. Similarly, the repair lines serve dual purposes as both conductive pathways for normal operation and as repair paths for defective areas. This multi-functionality improves defect detection capability while minimizing the increase in device complexity by reusing existing structural elements for detection and repair functions.