Short Circuit Defect Detection in OLED Wire Meshes
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Solution Overview
Problem
Detecting and locating short circuit defects in organic light emitting display apparatuses is challenging due to the complex structure of overlapping wires, making it difficult to identify and repair defects effectively.
Innovation Solution
A method involving the use of potential difference monitoring between wires, where power receiving and feeding members are connected to both ends of the wires or their sections, allowing for the detection of short circuits by applying voltage and measuring potential differences, thereby identifying defective lines and their locations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If potential difference monitoring is applied to detect short circuit defects between overlapping wires, then detection accuracy is improved, but the complexity of the inspection system increases
Solution Approach 1:
The patent extracts the inspection function from the complex display apparatus by using separate power feeding members and power receiving members that can be independently connected to specific wire ends. This allows the inspection system to focus solely on measuring potential differences without being entangled in the complex mesh structure of the display wires, thereby improving detection accuracy while managing system complexity.
Solution Approach 2:
The patent introduces power feeding members and power receiving members as intermediary components between the inspection system and the wire structure. These intermediaries simplify the inspection process by providing controlled voltage application and measurement points, eliminating the need for direct complex connections to the wire mesh while enabling accurate potential difference monitoring.
2Difficulty of detecting and measuring
If both ends of second wires are floated to enable independent voltage application, then detection capability is improved, but the difficulty of connecting power sources increases
Solution Approach 1:
The patent segments the wire structure into distinct first wires and second wires with specific connection configurations. By segmenting the power application points into separate power feeding members and power receiving members, the system enables independent voltage application to floated wire ends while maintaining manageable connection complexity through standardized connection interfaces.
3Measurement precision
If sequential voltage application to adjacent wires is performed, then defect localization accuracy is improved, but inspection time increases
Solution Approach 1:
The patent employs periodic action by sequentially applying voltage to adjacent wires in a systematic sequence. This periodic voltage application pattern enables the inspection system to methodically identify defective lines through potential difference monitoring while maintaining a structured, repeatable inspection process that balances accuracy with time efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enables easy detection and localization of short circuit defects in organic light emitting display apparatuses, facilitating repair processes and improving image quality by accurately identifying overlapping wire defects.
Implementation Method 1
monitoring a potential difference between regions of the second wire that are connected to the power receiving member and the power feeding member
Data Source
AI summary
A method of inspecting a short circuit defect between first wires extending in a first direction and a second direction intersecting the first direction and second wires extending in the first or second direction, the method including inspecting a short circuit defect between the first and second wires by using a potential difference monitored only in the second wires.