OLED Supervision Circuit for Short and Open Defect Detection

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Solution Overview

Problem

Existing supervision circuits for organic light emitting diode (OLED) devices lack an active monitoring mechanism to effectively detect and respond to failure states such as 'short' and 'open' defects, which can lead to hot spots or system deactivation, potentially causing damage or safety hazards.

Innovation Solution

A supervision circuit that includes a detection circuit to identify failure states (short or open defects) and generate decision signals based on duration, triggering a switching circuit to bypass the OLED device, ensuring timely and appropriate response to prevent unjust deactivation and maintain system safety.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a passive current-limiting component is connected serially to an OLED device, then the likelihood of dark OLED line defects is reduced, but the supervision mechanism remains inactive and cannot actively detect or respond to failure states

Engineering Contradiction:
Improvefault toleranceVSAvoidsupervision mechanism
Core Design Contradiction:
ReliabilityVSExtent of automation

Solution Approach 1:

The supervision circuit is designed to be autonomous and self-powered, drawing power from the OLED device itself through the existing constant current driver. The circuit automatically detects failure states, generates decision signals, and triggers bypass actions without requiring external power sources or control systems, enabling the system to supervise and protect itself

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces passive mechanical/current-limiting protection with an active electronic supervision system that uses voltage detection, signal processing, and electronic switching to monitor and respond to OLED failure states, transitioning from passive to active protection mechanisms

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Object-affected harmful factors

If the supervision circuit bypasses the OLED device in response to detected failure states, then system safety is improved, but unjust bypassing may occur due to transient conditions such as turn-on transitions or current ripple

Engineering Contradiction:
Improvesafety hazardsVSAvoidfalse bypassing
Core Design Contradiction:
Object-affected harmful factorsVSReliability

Solution Approach 1:

The supervision circuit performs preliminary detection and evaluation of failure states before triggering bypass actions. By monitoring voltage conditions and requiring sustained failure states beyond transient periods, the circuit prepares and validates decisions in advance, preventing premature or unjust bypassing while maintaining readiness to act when truly needed

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The circuit dynamically responds to failure conditions by adjusting its decision-making based on the duration and persistence of detected states. It distinguishes between transient fluctuations (such as turn-on transitions or ripple) and sustained failures, adapting its bypass triggering accordingly to avoid false positives while maintaining safety

Inventive Principle:
Principle #15Dynamics

3Measurement precision

If the supervision circuit monitors both short and open defects with individual time intervals, then detection precision is improved, but circuit complexity increases

Engineering Contradiction:
Improvefailure state detectionVSAvoiddetection circuit
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The supervision circuit is designed with multi-functional detection capabilities that can identify both short circuit and open circuit failure states using a unified detection architecture. The same detection circuit and switching mechanism handle multiple failure modes, reducing overall complexity while maintaining precise detection of different defect types through distinct time interval parameters

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentEP2591639B8Supervision circuit for organic light emitting diode
Publication Date: 2016.06.15 OLEDWORKS GMBH

AI summary

The invention relates to supervision circuits (10) for supervising organic light emitting diode devices (1) via detection circuits (20) for detecting failure states of the organic light emitting diode devices (1) and for generating decision signals in response to detected failure states of the organic light emitting diode devices (1), which detected failure states have durations equal to or larger than time intervals. In response to the decision signals, the organic light emitting diode devices (1) can be bypassed and deactivated through switching circuits (30) such as bi-stable circuits. The failure states may include that the organic light emitting diode devices (1) have a relatively low impedance or "short" and a relatively high impedance or "open". The supervision circuit (10) further prevents the organic light emitting diode devices (1) from being bypassed unjustly. The supervision circuits (10) may be autonomous circuits that only receive power via the organic light emitting diode devices (1) and may be automatic circuits that automatically reset themselves after turn-off.