OLED Display Panel Test Circuit Short Circuit Prevention
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Solution Overview
Problem
The high temperature generated during laser cutting in organic light-emitting diode display panels can cause conductor materials to melt or crack, leading to short circuits between adjacent traces, which affects the manufacturing process and yield.
Innovation Solution
Incorporating transistors at the ends of traces and using a control line to turn them on or off, allowing for electrical conductivity during testing and ensuring open circuits post-laser cutting to prevent short circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If laser cutting is used to remove test circuit, then test circuit can be efficiently removed, but high temperature causes conductor material to melt or crack resulting in short circuits
Solution Approach 1:
The patent applies preliminary action by extending traces beyond the test circuit region before laser cutting occurs. This ensures that even if laser cutting causes conductor material to melt or crack, the extended traces maintain electrical isolation and prevent short circuits between adjacent traces. The traces are prepared in advance to withstand the harmful effects of laser cutting.
Solution Approach 2:
The patent uses an intermediary approach by introducing a specific trace structure that acts as a mediator between the laser cutting process and the electrical isolation requirement. The extended trace design with proper spacing and structural features serves as an intermediary element that absorbs or prevents the propagation of thermal damage from laser cutting, thereby maintaining electrical isolation.
2Ease of manufacture
If laser cutting is used to remove test circuit, then manufacturing process is simplified, but organic molecules crack into conductive small molecules causing short circuits
Solution Approach 1:
The patent applies preliminary action by designing traces that extend beyond the test circuit region before laser cutting. This pre-extension ensures that when laser cutting removes the test circuit, the traces are already positioned to maintain electrical isolation and prevent organic molecules from cracking into conductive small molecules that could cause short circuits.
Solution Approach 2:
The extended trace structure serves as an intermediary element between the laser cutting process and the electrical isolation requirement. It absorbs or prevents the propagation of thermal damage that would otherwise cause organic molecules to crack and become conductive, thereby maintaining reliability during the simplified manufacturing process.
3Reliability
If traces are extended beyond test circuit, then electrical isolation is maintained after cutting, but trace length increases causing more material usage
Solution Approach 1:
The patent applies local quality by extending traces only in specific locations where electrical isolation is critical, rather than uniformly extending all traces. The extension is localized to areas beyond the test circuit region where laser cutting occurs, using conductor material only where necessary to maintain isolation and prevent short circuits.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively prevents short circuits between traces, enhancing the manufacturing process and reducing defects in organic light-emitting diode display panels by controlling the transistor states during and after laser cutting.
Implementation Method 1
the test circuit and the substrate are cut off by laser cutting or the like. However, high temperature generated during the laser cutting process may cause a conductor material of an original trace to melt, splash or remain
Data Source
AI summary
An organic light-emitting diode display panel, a method of manufacturing the same, and a display device are provided. The organic light-emitting diode display panel includes a flexible substrate defined with a test circuit region thereon. The test circuit region is provided with a test circuit and defined with a circuit trace region. The circuit trace region includes a plurality of traces, a plurality of transistors, a control line, and at least one pin. Each one of the traces is connected to one of the transistors. The control line is electrically connected to a control end of each of the transistors to turn on or turn off the transistors to avoid the circuit from short-circuiting.