OLED Test Fixture with Movable Probe Arm for Multi-Angle Measurement
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current illuminating fixtures for OLED test element groups are limited to single-angle measurements, cannot accommodate varying thicknesses, and are not adaptable for different types of test elements, leading to poor contact and potential damage during testing.
Innovation Solution
An illuminating fixture with a sample placement area, luminescent point control switches, an intelligence control system, a scanning system, printed circuit board, wires, and probes with adjustable probe arms and pressure sensors, allowing for multi-angle measurements and automatic positioning and pressure control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a fixed-position probe fixture is used, then the structure is simple and easy to manufacture, but the measurement angle is limited and cannot perform multi-angle measurements
Solution Approach 1:
The probe is made movable through a transmission device that enables both linear movement (up and down direction) and rotation. This dynamic capability allows the probe to reach different measurement positions and angles on the OLED panel, transforming a static fixture into a dynamic measurement system that can perform multi-angle and large-angle measurements.
Solution Approach 2:
The measurement function is divided into two independent subsystems: the probe arm handles positioning and angle adjustment, while the transmission device handles the actual probe movement and rotation. This segmentation allows each subsystem to be optimized independently and simplifies the overall control architecture.
2Adaptability or versatility
If a universal fixture design is not used, then the fixture can be optimized for a specific TEG type, but the fixture cannot accommodate different types of TEGs, resulting in resource waste
Solution Approach 1:
The fixture is designed with a universal sample placement area that can accommodate different types of OLED test element groups. The probe arm and transmission device combination provides a universal interface that can adapt to various TEG configurations, allowing a single fixture design to serve multiple measurement needs across different OLED product types.
3Adaptability or versatility
If probe position is not adjustable, then the fixture structure is simple, but the probe cannot adapt to different TEG thicknesses, causing poor contact and probe damage
Solution Approach 1:
The probe arm provides dynamic positioning capability that allows the probe to adjust its position vertically (up and down direction) to match different TEG thicknesses. This ensures consistent contact pressure and reliable electrical connection regardless of the specific OLED panel thickness being tested.
4Extent of automation
If manual probe positioning is used, then the control system is simple, but the measurement position accuracy and automation level are low
Solution Approach 1:
The intelligence control system receives positioning information from the scanning system and automatically adjusts the probe arm position accordingly. This closed-loop feedback mechanism ensures high measurement position accuracy while maintaining automation, as the system continuously monitors and corrects probe positioning based on the required measurement coordinates.
Data Source
AI summary
An illuminating fixture and a device are provided. The illuminating fixture includes an intelligence control system, a scanning system, wires, and at least two sets of probes. One end of the probe is connected with a probe arm, and the probe arm is configured to control a slide movement of the probe along an up and down direction and rotation of the probe. the scanning system positions a measurement position of a test element group, and the intelligence control system is configured to automatically adjust a position of the probe by the probe arm according to the measurement position positioned by the scanning system.