Display Panel Luminance Inspection for OLEDoS SRU Uniformity

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Solution Overview

Problem

The challenge of performing short range uniformity (SRU) evaluation for display panels using OLEDoS technology is difficult due to their ultra-high resolution pixels, which complicates the assessment of luminance uniformity.

Innovation Solution

A method is introduced to inspect display panels by measuring luminance of specific pixel groups and a correction pixel, calculating average correction luminance, and determining defectiveness based on luminance dispersion, with correction pixels turned on sequentially while other groups remain off.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If OLEDoS technology is used to achieve ultra-high resolution pixels, then display resolution is improved, but difficulty of detecting and measuring luminance uniformity increases

Engineering Contradiction:
Improvedisplay resolutionVSAvoidluminance uniformity evaluation
Core Design Contradiction:
Manufacturing precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The display panel is divided into multiple regions (first region, second region, third region, fourth region) with different grayscale levels. Instead of evaluating the entire high-resolution display panel at once, the inspection method segments the panel into manageable regions that can be measured separately, making the luminance uniformity evaluation feasible despite the ultra-high resolution

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The inspection method changes the parameter being measured from individual pixel luminance to regional average luminance. By measuring the average luminance of multiple pixels in each region and comparing these averages, the method adapts the measurement approach to suit ultra-high resolution displays where individual pixel measurement is impractical

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If short range uniformity evaluation is performed on ultra-high resolution pixels, then luminance uniformity measurement accuracy should be improved, but measurement complexity increases

Engineering Contradiction:
Improveluminance uniformity measurementVSAvoidinspection process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The display panel is divided into multiple regions (first region, second region, third region, fourth region) with different grayscale levels. Instead of evaluating the entire high-resolution display panel at once, the inspection method segments the panel into manageable regions that can be measured separately, making the luminance uniformity evaluation feasible despite the ultra-high resolution

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The inspection method changes the parameter being measured from individual pixel luminance to regional average luminance. By measuring the average luminance of multiple pixels in each region and comparing these averages, the method adapts the measurement approach to suit ultra-high resolution displays where individual pixel measurement is impractical

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method effectively evaluates luminance uniformity, enabling accurate detection of defects in display panels with high resolution, ensuring quality standards are met.

Implementation Method 1

measuring first correction luminance of a correction pixel while the first group from among a plurality of pixels included in a display panel and the correction pixel are turned on

Methodology Applied
Scientific EffectElectroluminescence: Electroluminescence

Data Source

PatentUS12567348B2Method of inspecting display panel and display device
Publication Date: 2026.03.03 SAMSUNG DISPLAY CO LTD
  • US12567348B2 patent drawing
  • US12567348B2 patent drawing
  • US12567348B2 patent drawing

AI summary

According to one or more embodiments, a method of inspecting a display device may include measuring first luminance of each of first pixels included in a first group and measuring first correction luminance of a correction pixel while the first group and the correction pixel are turned on, measuring second luminance of each of second pixels included in a second group and measuring second correction luminance of the correction pixel while the second group and the correction pixel are turned on, measuring third luminance of each of third pixels included in a third group and measuring third correction luminance of the correction pixel while the third group and the correction pixel are turned on, measuring fourth luminance of each of fourth pixels included in a fourth group and measuring fourth correction luminance of the correction pixel while the fourth group and the correction pixel are turned on.