On-Chip Diagnostic Circuitry for Multi-Cycle Signal Sampling
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Solution Overview
Problem
Existing chip performance assessment methods lack efficient and accurate means to determine performance metrics such as duty cycle and slew rate over multiple cycles of input signals, which are crucial for understanding the effects of variable loading and drive strength in integrated circuits.
Innovation Solution
The implementation of on-chip diagnostic circuitry with a trigger generation module, memory, and delay elements allows for the acquisition of samples of input signals, enabling the determination of duty cycle and slew rate by generating trigger signals and using slew rate diagnostic circuitry to produce pulse signals indicative of signal transitions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If on-chip diagnostic circuitry is implemented to measure performance metrics over multiple cycles, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent combines multiple diagnostic functions (sampling, delay generation, signal comparison) into a single integrated on-chip diagnostic circuitry block, merging previously separate measurement functions into one unified structure that reduces overall system complexity while maintaining measurement precision
Solution Approach 2:
The diagnostic circuitry is designed to perform multiple functions simultaneously: it can measure duty cycle, slew rate, and other timing parameters across multiple signal cycles using the same core components (samplers, delay elements, comparators), making the circuit universal and reducing the need for separate dedicated measurement circuits for each parameter
2Measurement precision
If multiple cycles of signal samples are acquired, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The diagnostic circuitry continuously samples and processes signal cycles without interruption, maintaining continuous measurement action across multiple cycles rather than stopping between cycles, which reduces total measurement time while still gathering data from multiple cycles for improved precision
Solution Approach 2:
The circuit pre-generates multiple delay signals and prepares sampling channels in advance before the actual measurement is needed, so that when measurement is required, the data is already prepared and can be quickly processed, reducing the effective measurement time
Data Source
AI summary
A system and integrated circuits are provided for determining performance metrics over a plurality of cycles of an input signal using on-chip diagnostic circuitry. The system comprises a trigger generation module configured to generate a trigger signal, and diagnostic circuitry coupled with the trigger generation module. The diagnostic circuitry comprises a memory comprising a plurality of data lines, and a plurality of delay elements, each delay element of the plurality of delay elements connected between consecutive data lines of the plurality of data lines. The diagnostic circuitry is configured to receive at least one input signal, and write, upon receiving the trigger signal, values on the plurality of data lines to the memory, thereby acquiring samples of a plurality of cycles of the input signal.