On-Chip Transient Settling Reconstruction by Dual-Time Sampling

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Solution Overview

Problem

Existing on-chip monitoring techniques for high-speed integrated circuits are impractical for mass production due to the need for external probing, which is costly, bulky, and time-consuming, limiting their ability to optimize transient settling behavior in real-time.

Innovation Solution

An apparatus and method for on-chip reconstruction of transient settling behavior using a first and second sampling circuit to generate sample outputs at different times, with a signal subtraction and conversion circuit to produce a digitized representation of the settling behavior, allowing for internal monitoring without significant performance reduction.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If external probing is used to monitor transient settling behavior, then measurement precision is improved, but device complexity and manufacturing cost increase

Engineering Contradiction:
Improvetransient settling behavior measurementVSAvoidexternal probing setup
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts only the essential information needed for transient settling behavior monitoring by sampling the output signal at specific time points during the settling period. Instead of externally probing the entire waveform, the circuit internally captures discrete sample values that represent the settling behavior, eliminating the need for complex external measurement equipment while maintaining measurement precision.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent creates an internal copy of the transient settling behavior data by sampling and storing sample values within the circuit itself. This internal copying mechanism allows the circuit to reconstruct and analyze its own transient behavior without requiring external observation, thereby reducing device complexity while preserving measurement accuracy.

Inventive Principle:
Principle #26Copying

2Loss of information

If external probing is used for measurement, then transient settling behavior can be observed, but manufacturing cost and measurement time increase

Engineering Contradiction:
Improvetransient waveform data acquisitionVSAvoidmass production feasibility
Core Design Contradiction:
Loss of informationVSEase of manufacture

Solution Approach 1:

The patent implements self-service monitoring where the circuit autonomously samples and records its own transient settling behavior internally. The circuit performs self-measurement by capturing sample values during normal operation without requiring external intervention, equipment, or manual probing. This self-service approach eliminates the time-consuming external measurement process and makes the technique feasible for mass production while preserving complete transient waveform information.

Inventive Principle:
Principle #25Self-service

3Measurement precision

If high-resolution quantizer is used for foreground monitoring, then measurement precision is improved, but device complexity and power consumption increase

Engineering Contradiction:
Improvesettling behavior quantizationVSAvoidmonitoring circuit power consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent applies partial action by sampling the output signal at specific discrete time points during the settling period rather than continuously quantizing the entire waveform. By capturing only the essential sample values that represent the settling behavior, the circuit achieves adequate measurement precision with significantly reduced power consumption compared to high-resolution continuous quantization, while still providing sufficient information for transient settling analysis.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS11271580B2Apparatus and method for on-chip reconstruction of transient settling behavior
Publication Date: 2022.03.08 INTERUNIVERSITAIR MICRO ELECTRONICS CENT (IMEC VZW)
  • US11271580B2 patent drawing
  • US11271580B2 patent drawing
  • US11271580B2 patent drawing

AI summary

An apparatus is provided for on-chip reconstruction of transient settling behavior. The apparatus comprises a first sampling circuit configured to sample a tracked analog signal output from a circuit under test over an operating period at a first sampling time, thereby generating a first sample output. In addition, the apparatus comprises a second sampling circuit configured to sample the tracked analog signal output at a second sampling time, thereby generating a second sample output. The apparatus further comprises a signal subtraction circuit configured to perform subtraction of the first sample output and the second sample output, thereby generating a difference signal. Moreover, the apparatus comprises a signal conversion circuit configured to output the difference signal in the digital domain.