On-Chip Temperature Sensor Using Voltage Generator
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
High-end microprocessor chips face performance degradation, increased leakage power, and reliability issues due to temperature variations, which existing thermal diode-based temperature sensing methods cannot adequately address without requiring external pins and companion chips.
Innovation Solution
A compact on-chip temperature sensing system using a voltage generator that produces multiple voltage levels responsive to temperature changes, allowing for accurate temperature measurement and digital control signals to adjust core frequencies and voltages, with calibration capabilities to compensate for manufacturing and power supply variations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If thermal diodes are placed at several locations on the chip to obtain temperature information, then temperature measurement capability is improved, but the number of external pins and device complexity increases
Solution Approach 1:
The patent merges the temperature sensing function with the existing voltage generator circuitry on the same chip. The voltage generator produces multiple voltage levels that are temperature-dependent, and the temperature is extracted by measuring the time for a capacitor to charge to these voltage levels. This integration eliminates the need for separate thermal diodes and external companion chips, reducing pin count and device complexity while maintaining temperature measurement capability.
Solution Approach 2:
The patent replaces the mechanical/physical thermal diode-based temperature sensing system with an electrical system. Instead of using physical thermal diodes that require external pins and companion chips for reading, the invention uses voltage levels generated by a voltage generator that change with temperature. The temperature is measured through electrical timing measurements (capacitor charging time), substituting the mechanical thermal sensing approach with an electrical measurement approach that integrates directly on-chip.
2Productivity
If higher clock frequencies and smaller manufacturing technologies are used to increase processor performance, then productivity is improved, but power consumption and temperature increase
Solution Approach 1:
The patent implements a feedback mechanism where the temperature is continuously monitored using the voltage generator and timing measurement circuitry, and this temperature information is fed back to control the processor's operating conditions. The calculated temperature can be used to adjust clock frequencies and voltages dynamically, allowing the processor to maintain high performance when cool and reduce power consumption when hot, thus managing the trade-off between productivity and energy loss.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate, on-chip temperature sensing with reduced external pin requirements, minimizing die size and chip pin count, while maintaining performance and reliability by adjusting operating conditions based on precise temperature measurements.
Implementation Method 1
a voltage generator configured to generate a first voltage level and a second voltage level dependent on an operating temperature. In response to a given change in the operating temperature, the first and second voltage levels may change by first and second amounts, respectively
Implementation Method 2
to measure the first voltage level, the second voltage level, and the third voltage level, the circuitry may be configured to measure a time for a capacitor to charge to each of the first voltage level, the second voltage level, and the third voltage level, respectively
Data Source
AI summary
Embodiments of a temperature sensing apparatus are disclosed. The apparatus may include a voltage generator and circuitry. The voltage generator may generate a first voltage level and a second voltage level dependent on an operating temperature. In response to a given change in the operating temperature, the first and second voltage levels may change, with the second voltage level changing by a different amount than the first voltage level. The voltage generator may generate a third voltage level. The circuitry may measure the first voltage level, the second voltage level, and the third voltage level, and may calculate the operating temperature dependent on a ratio of a difference between the first voltage level and the second voltage level and the third voltage level.