On-Chip Tester for Autonomous SoC Field Testing
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Solution Overview
Problem
Current integrated circuit testing methods require external automated test equipment, making it impractical for structural field testing in end-user systems, especially for safety-critical applications like advanced driver assist systems (ADAS) in vehicles, where tests need to be performed without external devices to ensure safety and operational efficiency.
Innovation Solution
The implementation of an on-chip tester within the System-on-Chip (SoC) device that includes a decoder module, multiplexer module, memory module, and configuration register, allowing for self-contained field testing by decoding stored test data to apply test stimuli to design-for-testing subsystems without external ATE, and supporting both pre-defined and user-defined tests.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If external automated test equipment is used for structural testing, then testing capability is provided, but portability and field testing capability are lost
Solution Approach 1:
The patent extracts the essential testing functionality from external ATE and implements it as an on-chip tester within the SoC device. This extraction enables the device to perform structural testing independently in the field without requiring external test equipment, directly resolving the contradiction between having testing capability and maintaining field testing capability.
Solution Approach 2:
The on-chip tester enables the SoC device to test itself autonomously. The device includes its own testing capability, eliminating the need for external test equipment. This self-service approach allows the device to perform structural testing in the field independently, resolving the contradiction by making the device both reliable and portable.
2Reliability
If comprehensive test stimuli are applied, then testing coverage is improved, but test stimulus volume increases
Solution Approach 1:
The patent changes the parameter of test stimulus representation from raw comprehensive test data to an encoded format with control words and data words. This parameter change in data representation allows comprehensive testing coverage to be achieved with reduced stimulus volume by using compact encoding schemes that can be decoded to generate the full test sequences.
Solution Approach 2:
The test initiator prepares and loads encoded test data into the on-chip tester before the actual testing operation. This preliminary action of pre-loading and encoding the test stimuli allows the device to perform comprehensive testing without requiring large volumes of test data to be present during operation, as the encoded form is more compact.
Data Source
AI summary
On-chip field testing methods and apparatus are disclosed. Example on-chip testers disclosed herein include a decoder having a test data input and a test stimuli interface. Disclosed example on-chip testers also include a multiplexer having a first multiplexer interface coupled to the test stimuli interface, a second multiplexer interface coupled to an automatic test equipment interface, a third multiplexer interface coupled to a design-for-testing subsystem interface and an interface selection input. Disclosed example on-chip testers further include a memory having a memory interface coupled to the test data input.