On-Chip Trim Circuit for Self-Measurement of IC Components
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Solution Overview
Problem
Integrated circuits face challenges in correcting fabrication process-induced changes in analog and digital components due to the need for external connections and expensive measurement equipment, limiting productivity and requiring additional design complexities and test operations.
Innovation Solution
An integrated circuit with a trim function that includes a trim value generator, a measurement target (analog or digital component), a determination unit, and storage, allowing for internal measurement and storage of trim values without external connections or expensive devices, using a reference signal to adjust and store trim values for correcting component characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external measurement terminals and connections are used for testing, then measurement capability is provided, but device complexity and design inconvenience increase
Solution Approach 1:
The patent extracts the measurement function from external testing equipment and embeds it within the integrated circuit itself. The on-chip analog-to-digital converter and trim value generator are integrated into the circuit, eliminating the need for external measurement terminals and connections while maintaining measurement capability.
Solution Approach 2:
The integrated circuit performs self-measurement and self-trimming operations using embedded components. The circuit measures its own component characteristics and automatically generates trim values without requiring external measurement equipment or additional test terminals, enabling the system to serve its own measurement needs.
2Measurement precision
If expensive high-precision measurement equipment is used, then measurement accuracy is improved, but productivity decreases due to limited testing capacity
Solution Approach 1:
The patent replaces expensive, limited-capacity external measurement equipment with inexpensive, integrated on-chip measurement circuits. The embedded analog-to-digital converter and trim value generator provide sufficient measurement accuracy at a fraction of the cost, enabling mass production testing without the productivity limitations of external equipment.
Solution Approach 2:
The embedded measurement and trimming circuitry is integrated into the standard product design, making it universally applicable to all production units. This eliminates the need for separate external measurement equipment and enables simultaneous or sequential testing of multiple components using the same integrated circuit architecture.
3Manufacturing precision
If additional test operations and external connections are required, then component characteristics can be corrected, but ease of operation and productivity are reduced
Solution Approach 1:
The patent merges the measurement, analysis, and trimming functions into a single integrated operation within the circuit. The trim value generator, analog-to-digital converter, and component measurement functions are combined, allowing characteristic correction to be performed as part of the normal operation without separate test procedures or external connections.
Solution Approach 2:
The trimming function is built into the circuit design and can be performed automatically during or before normal operation. By embedding the trim value generator and measurement circuits, the system can perform preliminary characterization and correction without requiring additional post-fabrication test operations or external equipment.
Data Source
AI summary
Disclosed is an integrated circuit having a trim function for an embedded analog component or digital component. The integrated circuit includes a trim value generator configured to provide a varying trim value, a measurement target selected from a digital component and an analog component and configured to provide a measured value as a result of an internal operation corresponding to the trim value, a determination unit configured to determine the measured value based on a reference value received from the outside and to provide a trim control signal when the measured value corresponds to a preset target value, and a storage configured to store a current trim value as a measured result value in response to the trim control signal.