On-Chip Up-Conversion for Millimeter Wave Noise Measurement
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Solution Overview
Problem
The challenge in measuring the noise figure of millimeter wave receivers using conventional Y factor testing methods is exacerbated by the difficulty in handling high-frequency signals and the inaccuracies introduced by process variations in gain estimation through cold noise methods.
Innovation Solution
The implementation of an on-chip up-conversion system that allows for Y method-based testing using lower frequency conventional external noise sources, enabling accurate separation of noise contributions and determination of noise characteristics by up-converting an external test signal to the operating range of the receiver.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional Y factor testing method is used with external calibrated noise source, then noise figure measurement is accurate, but handling millimeter wave signals becomes difficult and signal corruption occurs
Solution Approach 1:
The patent transitions the noise figure measurement from external off-chip testing to internal on-chip testing. By integrating the noise source and measurement circuitry within the chip itself, the system eliminates the need to handle millimeter wave signals externally while maintaining measurement accuracy. This dimensional shift from external to internal testing resolves the contradiction between measurement precision and ease of operation.
Solution Approach 2:
The patent introduces an on-chip noise source as an intermediary element that generates test signals internally. This intermediary noise source replaces the need for external calibrated noise sources, allowing accurate noise figure measurement without the complexity of handling millimeter wave signals externally. The on-chip noise source acts as a mediator between the measurement requirements and the physical constraints of millimeter wave handling.
2Ease of operation
If cold noise method with internally generated test signal is used, then handling of millimeter wave signals is simplified, but gain estimation accuracy deteriorates due to process variation
Solution Approach 1:
The patent introduces an on-chip noise source as an intermediary that provides a known reference signal for gain estimation. This intermediary element enables accurate gain measurement by providing a calibrated reference against which the receiver gain can be determined, resolving the accuracy issues of cold noise methods while maintaining the simplicity of on-chip testing.
Solution Approach 2:
The patent changes the fundamental parameter being measured from direct gain estimation to noise figure measurement using a Y-factor approach. By measuring the ratio of noise powers with the noise source on and off, the system determines gain and noise figure simultaneously, eliminating the need for separate gain calibration and improving overall measurement accuracy.
3Adaptability or versatility
If on-chip up-conversion is implemented, then external lower frequency noise sources can be used, but device complexity increases
Solution Approach 1:
The on-chip up-conversion circuit serves multiple functions: it up-converts external low-frequency noise signals to the receiver operating frequency, provides an internal reference for gain measurement, and enables Y-factor noise figure measurement. This multi-functionality justifies the added complexity by providing versatility in noise source options and measurement capabilities.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables accurate noise figure determination for millimeter wave receivers by isolating noise contributions and improving measurement accuracy, overcoming the limitations of conventional methods.
Implementation Method 1
an up-conversion mixer configured to up-convert a test signal to generate an RF test signal
Data Source
AI summary
Noise test systems, methods, and circuitries are provided for determining a noise characteristic of a receiver. In one example, an integrated circuit device includes an active RF receiver element configured to process a radio frequency (RF) signal to generate a receiver signal; an up-conversion mixer configured to up-convert a test signal to generate an RF test signal; an attenuator configured to selectively adjust a power of the RF test signal to generate adjusted RF test signals; and a coupler configured to couple the adjusted RF test signals to an input of the active RF receiver element. In another example, instead of or in addition to the attenuator, the integrated circuit device includes first, second, and third power sensors configured to measure a power of the test signal, the RF test signal, and the receiver signal, respectively. The power measurements are used to determine the noise characteristic.