On-Chip Voltage Regulators for Multi-Voltage IC Testing
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Solution Overview
Problem
Conventional automatic test equipment (ATE) is limited in detecting defects in integrated circuits due to the inability to supply a range of operating voltages to multiple subunits, as each power pin can only deliver one input voltage, restricting voltage-based testing to a narrow range bounded by the highest minimum and lowest maximum operating voltages across the subunits.
Innovation Solution
Incorporating on-chip voltage regulator circuits that convert a single input voltage into multiple output voltages, allowing each subunit to be tested under its corresponding range of operating voltages, thereby enabling broader defect detection during testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If conventional ATE power pins supply power to multiple subunits, then the number of power pins is reduced, but the voltage-based testing capability is limited to a narrow voltage range
Solution Approach 1:
The patent divides the single power pin into multiple virtual power pins by implementing on-chip voltage regulator circuits. Each voltage regulator circuit generates a separate output voltage for each subunit, effectively segmenting the power delivery function. This allows each subunit to receive independently controlled voltages, expanding the voltage testing range without increasing the physical number of power pins.
Solution Approach 2:
The on-chip voltage regulator circuits act as intermediary components between the single ATE power pin and the multiple subunits. These regulators convert the single input voltage into multiple output voltages, enabling broader voltage-based testing while maintaining compatibility with the limited power pin interface.
2Ease of operation
If a single input voltage is supplied to multiple subunits, then the power pin configuration is simplified, but defects associated with varying operating voltages cannot be detected
Solution Approach 1:
The patent introduces dynamic voltage control by implementing voltage regulator circuits that can independently adjust output voltages for each subunit. This dynamic capability allows the system to apply varying operating voltages during testing, enabling detection of voltage-sensitive defects while maintaining simplified power pin configuration.
Solution Approach 2:
The voltage regulator circuits enable independent parameter changes for each subunit's operating voltage. By adjusting the output voltage of each regulator, the system can test each subunit at its optimal operating voltage, thereby improving defect detection capability without complicating the power pin interface.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for a more comprehensive testing of integrated circuits, reducing degradation and failure rates by enabling the detection of defects across a broader range of operating voltages, improving the reliability of chip testing.
Implementation Method 1
one or more voltage regulator circuits that convert a first input voltage into a first plurality of output voltages during a first test
Data Source
AI summary
One embodiment of the present invention sets forth an integrated circuit. The integrated circuit includes a plurality of subunits associated with a plurality of operating voltages. The integrated circuit also includes one or more voltage regulator circuits that convert a first input voltage into a first plurality of output voltages during a first test, wherein the plurality of output voltages is delivered to the plurality of subunits via a plurality of output channels.