On-Die Thermal Sensor for Dynamic Self-Refresh Cycle Control
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Solution Overview
Problem
Integrated circuits face challenges in reducing power consumption for refresh operations and managing internal temperature, which affects data retention and operation errors, necessitating an efficient on-die thermal sensor (ODTS) to optimize auto-self refresh operations.
Innovation Solution
The ODTS includes a temperature sensor, reference voltage generator, voltage comparator, and pulse generator to control the self refresh operation cycle based on internal temperature, generating flag signals to adjust the refresh cycle and minimize power consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If refresh operation is performed frequently to prevent data loss, then data retention reliability is improved, but power consumption increases
Solution Approach 1:
The patent implements dynamic refresh cycle adjustment based on temperature sensing. The refresh operation transitions from a fixed cycle to a variable cycle that adapts to temperature conditions, allowing the system to optimize between data retention reliability and power consumption by modifying refresh frequency according to actual thermal environment
Solution Approach 2:
The patent changes the refresh cycle parameter dynamically based on temperature measurements. By sensing temperature and adjusting the refresh cycle accordingly (shorter cycles at high temperature, longer cycles at low temperature), the system optimizes the balance between maintaining data integrity and reducing power consumption during refresh operations
2Use of energy by moving object
If refresh cycle is extended to reduce power consumption, then power consumption is reduced, but data retention time becomes insufficient
Solution Approach 1:
The patent dynamically adjusts the refresh cycle parameter based on temperature conditions. When temperature is low, longer refresh cycles are used to reduce power consumption while maintaining adequate data retention. When temperature rises, the refresh cycle shortens automatically to ensure data retention requirements are met, thus optimizing the trade-off between power consumption and retention time
3Productivity
If internal temperature increases due to higher integration level or operation speed, then productivity is improved, but operation error increases
Solution Approach 1:
The patent implements a feedback mechanism where temperature is continuously sensed and used to control the refresh operation cycle. This closed-loop control allows the system to respond to temperature increases caused by high-speed operation or high integration levels, adjusting refresh frequency to prevent operation errors while maintaining high productivity
Solution Approach 2:
The system dynamically adjusts refresh operation parameters in response to temperature changes caused by high-speed operation. The refresh cycle becomes a dynamic parameter that adapts to thermal conditions, allowing the system to maintain reliability even when operating at high speeds that generate increased heat
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration optimizes the ODTS for auto-self refresh operations, reducing power consumption and preventing data loss by accurately controlling the self refresh cycle based on internal temperature, thereby enhancing data retention and reducing operation errors.
Implementation Method 1
a temperature sensor, configured to sense an internal temperature of an integrated circuit and to generate a temperature information voltage in inverse proportion to the sensed temperature
Data Source
AI summary
A semiconductor memory device includes a reference voltage generator for generating a plurality of reference voltages each having different voltage levels in response to a self refresh enable control signal, and a voltage comparator for generating a result signal that controls a self refresh operation cycle by comparing each of the plurality of reference voltages with a temperature information voltage that represents an internal temperature of an integrated circuit.