On-Die Virtual Probes for Transient Voltage Monitoring
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Solution Overview
Problem
Existing integrated circuit (IC) voltage sensing techniques are inadequate for monitoring both steady-state and transient voltage drops at flexible, dynamic locations within ICs, often masking critical voltage fluctuations that can impact performance and integrity.
Innovation Solution
The implementation of an on-die virtual probe (ODVP) using programmable logic blocks or hardwired components to generate a voltage-controlled oscillating signal, allowing for real-time monitoring of both steady-state and transient voltages at flexible locations, including gigahertz sampling rates.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional voltage sensing techniques are used, then steady state voltages can be monitored at fixed locations, but transient voltage fluctuations cannot be detected and measurement locations are not flexible
Solution Approach 1:
The patent implements dynamic voltage sensing by making the measurement locations reconfigurable through programmable logic blocks that can be programmed to different locations on the IC. The system transitions from fixed sensing points to dynamically selectable locations, allowing the measurement system to adapt to different monitoring needs and detect transient voltage fluctuations at any desired location on the chip.
Solution Approach 2:
The voltage sensing system is designed with multi-functionality to monitor both steady-state and transient voltages at multiple reconfigurable locations. The same hardware infrastructure serves multiple measurement purposes and locations, eliminating the need for separate fixed sensing circuits for each location and enabling flexible adaptation to different measurement requirements.
2Adaptability or versatility
If traditional fixed location sensing is used, then device complexity is reduced, but the ability to monitor transient voltages at multiple locations is lost
Solution Approach 1:
The patent changes the operational parameters of existing logic blocks by programming them to function as voltage sensing elements. Instead of adding dedicated sensing hardware at multiple locations, the system reconfigures the operational state and function of programmable logic blocks, allowing them to serve as voltage sensors at different locations based on programming rather than physical hardware differences.
Solution Approach 2:
The system uses copies of programmable logic blocks that can be instantiated at multiple locations on the IC. Each logic block copy can be programmed to perform voltage sensing at its specific location, providing multi-location monitoring capability through replication of functional units rather than through complex centralized sensing architecture.
3Measurement precision
If higher sampling rates are implemented to capture transient voltages, then measurement precision improves, but power consumption increases
Solution Approach 1:
The patent implements continuous voltage monitoring at high sampling rates using the inherent operational characteristics of the programmable logic blocks. These blocks can continuously sample and hold voltage information without requiring additional power-intensive analog-to-digital conversion infrastructure, maintaining high measurement precision while managing power consumption through efficient use of existing digital circuitry.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate analysis and diagnosis of performance issues by providing detailed voltage measurements at target locations, improving IC design, operation, and maintenance by detecting transient and steady-state voltage drops that may otherwise go undetected.
Implementation Method 1
The voltage-controlled frequency oscillator circuitry comprises a plurality of circuitry components and is configured to generate a signal having a frequency related to a supply voltage
Implementation Method 2
a plurality of inverter circuits connected in series to form a loop circuitry configured to generate an oscillatory signal having a frequency related to a supply voltage
Data Source
AI summary
Some examples described herein provide for an on-die virtual probe in an integrated circuit structure for measurement of voltages. In an example, an integrated circuit comprises a voltage-controlled frequency oscillator circuitry and a processor circuitry. The voltage-controlled frequency oscillator circuitry comprises a plurality of circuitry components and is configured to generate a signal having a frequency related to a supply voltage. The voltage-controlled frequency oscillator circuitry is disposed at a location of the integrated circuit proximal to the supply voltage being monitored. The processor circuitry is configured to identify a relationship between the frequency of the signal and the supply voltage. The processor circuitry is also configured to determine a value of the supply voltage associated with the signal based on the identified relationship. The processor circuitry further monitors on-die transient voltages at the location of the integrated circuit based on the value of the supply voltage.