On-Die Circuitry for Serial Data Signal Testing
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Solution Overview
Problem
The increasing complexity of integrated circuits (ICs) makes it difficult and expensive to test high-speed serial data signal transmission and reception, as not all points on the IC are easily accessible for external testing, leading to challenges in calibrating and adjusting circuit components for optimal performance.
Innovation Solution
Incorporating on-die circuitry within the IC to enable self-testing capabilities, including bit error rate analysis, jitter, and noise generation, allowing for internal loop-back and external signal processing, effectively eliminating the need for external probes and reducing testing costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external test equipment is used to test high-speed serial data signal transmission and reception, then measurement capabilities are provided, but testing becomes difficult and expensive due to IC complexity and inaccessibility of internal test points
Solution Approach 1:
The patent combines test functions (oscilloscope, jitter tester, BER tester) directly into the IC device under test, merging the test equipment and DUT into a single integrated unit. This eliminates the need for separate external test equipment and complex probe connections, resolving the contradiction between providing measurement capabilities and avoiding testing complexity.
Solution Approach 2:
The IC performs self-testing by incorporating on-die test circuitry that can autonomously generate test signals, measure performance parameters, and report results without requiring external test equipment. The device tests itself, eliminating the need for expensive external instruments and simplifying the testing process.
2Ease of operation
If on-die test circuitry is incorporated in the IC, then testing becomes easier and more cost-effective, but the IC complexity increases
Solution Approach 1:
The test circuitry is designed to perform multiple test functions (oscilloscope, jitter analysis, BER testing) using shared hardware resources. This multi-functionality reduces the overall complexity compared to implementing separate dedicated test circuits for each function, while still providing comprehensive testing capabilities.
Solution Approach 2:
The patent uses existing IC infrastructure (logic elements, interconnects, I/O pads) as intermediaries to support test functions without requiring completely separate test-specific hardware. This leverages the existing device structure to minimize additional complexity while enabling easy self-testing.
Data Source
AI summary
An integrated circuit (“IC”) includes circuitry for use in testing a serial data signal. One such IC includes circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. One such IC also includes circuitry for receiving the serial data signal and performing a bit error rate (“BER”) analysis in such a signal. Such an IC provides output signals indicative of results of its operations. One such IC operates in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc.