On-Die Resistor Calibration Using External Reference Comparison

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Solution Overview

Problem

The calibration of on-die resistors integrated into system on chip (SoC) faces limitations due to low accuracy, as it relies on external calibration methods.

Innovation Solution

A semiconductor device with an on-die resistor circuit, a calibration circuit, and a calibration control circuit that performs calibration by generating a calibration current and comparing it with an external resistor to accurately set and store the resistance value of the on-die resistor.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If external calibration means are used to calibrate the on-die resistor, then the calibration can be performed, but the accuracy of calibration is not high

Engineering Contradiction:
Improvecalibration accuracyVSAvoidcalibration system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent merges the calibration circuit with the on-die resistor into a single integrated structure. The calibration circuit includes a calibration current source, a first converter that converts the voltage across the on-die resistor to a digital value, and a second converter that converts the voltage across a reference resistor to a digital value. By integrating these components on the same die, the system achieves high-accuracy calibration without requiring complex external calibration equipment, thus resolving the contradiction between calibration accuracy and device complexity.

Inventive Principle:
Principle #5Merging (Combining)

2Manufacturing precision

If the resistance value of the on-die resistor is adjusted through external calibration, then the impedance matching can be improved, but the calibration accuracy is limited

Engineering Contradiction:
Improveresistance value precisionVSAvoidcalibration process simplicity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The calibration system performs self-calibration by comparing the digital values obtained from the on-die resistor and the reference resistor. The controller automatically adjusts the on-die resistor value based on this comparison without requiring external calibration equipment or manual intervention. This self-service approach achieves high manufacturing precision while maintaining ease of manufacture, as the calibration process is automated and integrated into the device itself.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enhances the accuracy of on-die resistor calibration, allowing for precise resistance value adjustments within the semiconductor device, improving impedance matching and overall device performance.

Implementation Method 1

a current generating circuit configured to supply a calibration current to the on-die resistor and a comparing circuit configured to compare a first input voltage that is generated by the calibration current and the on-die resistor with a second input voltage that is generated by the calibration current and an external resistor

Methodology Applied
Scientific EffectOhm's Law: Ohm's Law

Implementation Method 2

a comparing circuit configured to compare the magnitude of a first input signal that is generated by the calibration current and the on-die resistor with a magnitude of a second input signal that is generated by the calibration current and an external resistor

Methodology Applied
Scientific EffectElectrical Resistance: Electrical Resistance

Data Source

PatentUS20240120904A1Semiconductor device including on-die resistor and method of calibrating on-die resistor
Publication Date: 2024.04.11 SK HYNIX INC
  • US20240120904A1 patent drawing
  • US20240120904A1 patent drawing
  • US20240120904A1 patent drawing

AI summary

A semiconductor device includes an on-die resistor circuit comprising an on-die resistor, a calibration circuit configured to perform a calibration operation on the on-die resistor, and a calibration control circuit configured to control the calibration operation of the calibration circuit. The calibration circuit includes a current generating circuit configured to supply a calibration current to the on-die resistor and a comparing circuit configured to compare the magnitude of a first input signal that is generated by the calibration current and the on-die resistor with a magnitude of a second input signal that is generated by the calibration current and an external resistor.