Optical Phased Array Calibration via Single-Pass Interference

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Solution Overview

Problem

Current optical phased array calibration methods are time-consuming and require multiple detector signals, making them inefficient for applications like LiDAR and biomedical imaging, where fast and reliable calibration is crucial.

Innovation Solution

A system and method for optical phased array calibration using a single-pass measurement of phase offset via interference signals, where light is phase-shifted and directed to antennas, with equal optical path lengths to a detector, allowing for valid calibration across a wide range of wavelengths, eliminating the need for iterative procedures and multiple detector signals.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple detector signals and iterative procedures are used for calibration, then measurement precision is improved, but calibration time increases significantly

Engineering Contradiction:
Improvephase offset measurement precisionVSAvoidcalibration time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent segments the calibration measurement into individual contributions from each optical element. By using a single detector to measure the total interference signal and systematically varying the phase of individual elements, the calibration process divides the measurement task into manageable segments that can be processed independently and combined to achieve precise phase offset determination for all elements simultaneously.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces an intermediary mathematical relationship based on interference theory. The single detector signal serves as an intermediary that encodes information from all optical elements. By analyzing the interference pattern and using the known phase variations, the system extracts individual phase offsets from the combined signal, eliminating the need for multiple detectors while maintaining measurement precision.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If multiple detector signals are used for calibration, then phase offset measurement accuracy is improved, but device complexity increases

Engineering Contradiction:
Improvephase offset measurement accuracyVSAvoiddetector array complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent merges the measurement function of multiple detectors into a single detector. By combining the optical paths from all elements to a single detection point, the system creates an interference pattern that contains information from all elements. This merging approach reduces device complexity while maintaining measurement accuracy through sophisticated signal analysis of the combined interference signal.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The single detector is designed to perform multiple functions: it detects the interference signal from all optical elements simultaneously, measures the total intensity, and provides data for extracting individual phase offsets. This multi-functional approach replaces what would traditionally require multiple specialized detectors, reducing overall device complexity while maintaining comprehensive measurement capability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Manufacturing precision

If iterative calibration procedures are used, then calibration accuracy is improved, but productivity decreases

Engineering Contradiction:
Improvecalibration accuracyVSAvoidcalibration throughput
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent applies preliminary action by pre-determining the phase variation patterns for each optical element before the actual measurement. The system establishes known phase modulation sequences and uses these predetermined patterns to systematically extract phase offset information. This preliminary setup eliminates the need for time-consuming iterative adjustments during calibration, as the measurement process is designed to directly yield the required phase information through the pre-planned phase variations.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables fast and efficient calibration of optical phased arrays by directly measuring individual phase offsets and phase functions of each element, reducing calibration time and improving reliability, allowing for precise beam steering and beam forming.

Implementation Method 1

light traversing the optical phase shifters is phase shifted

Methodology Applied
Scientific EffectPhase shifting:

Implementation Method 2

the transmitted light from all of the phase shifters is directed to the output optical distribution network and subsequently to the detector element which detects the transmitted light from each phase shifter as an interference signal

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentUS10790585B2Systems, methods, and structures for optical phased array calibration via interference
Publication Date: 2020.09.29 ANALOG PHOTONICS LLC
  • US10790585B2 patent drawing
  • US10790585B2 patent drawing
  • US10790585B2 patent drawing

AI summary

Aspects of the present disclosure describe systems, methods, and structures for optical phased array calibration that advantageously may be performed as a single-pass measurement of phase offset with respect to only a single interference measurement. In sharp contrast to the prior art—systems, methods, and structures according to aspects of the present disclosure advantageously produce phase offsets and phase functions of each element without time-consuming iterative procedures or multiple detector signals as required by the prior art.