Operation Voltage Calibration Using Stored Reference Codes
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Solution Overview
Problem
Existing electronic devices face challenges in setting their operation voltage to a target level, as the generated voltage level may differ from the required target level, necessitating a test to adjust it accordingly.
Innovation Solution
The electronic device and system employ a control pulse generation circuit and a voltage control code generation circuit to selectively generate control pulses and perform addition or subtraction operations on a logic bit set of a voltage control code, thereby adjusting the operation voltage to the target level during a test period.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If the voltage level of the operation voltage is adjusted to match the target level, then the manufacturing precision is improved, but the test time increases
Solution Approach 1:
The patent applies preliminary action by pre-storing the reference code in the electronic device before the test period begins. This allows the device to have the necessary calibration data readily available, eliminating the need to receive the reference code during each test iteration, thereby reducing test time while maintaining voltage level matching precision
Solution Approach 2:
The patent uses copying by storing a copy of the reference code within the electronic device's memory. This internal copy enables the device to perform voltage calibration operations without requiring continuous external reference code transmission, thus speeding up the testing process while preserving manufacturing precision
2Measurement precision
If the reference code is received during each test, then the measurement precision is maintained, but the productivity decreases
Solution Approach 1:
The reference code is loaded into the electronic device before the test period starts, enabling multiple tests to be performed without repeated external code transmission. This preliminary loading maintains measurement precision through accurate reference data while significantly improving test throughput
Solution Approach 2:
The electronic device serves itself by storing and utilizing its own internal reference code for voltage calibration during tests. This self-service capability eliminates the need for continuous external reference code provision, thereby maintaining measurement accuracy while enhancing productivity through faster test execution
Data Source
AI summary
An electronic device may include: a control pulse generation circuit configured to selectively generate one of a first control pulse and a second control pulse on the basis of a reference code during a test period; and a voltage control code generation circuit configured to perform an addition operation or subtraction operation on a logic bit set of a voltage control code to set the voltage level of an operation voltage on the basis of the first and second control pulses.


