Optical Aberration Identification via Nonlinear Beam Superposition

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Solution Overview

Problem

Current methods for correcting optical aberrations in imaging systems, such as confocal microscopes, are inefficient and limited in applicability due to slow processing and low correction of wavefront segments, restricting imaging depth and practical biomedical imaging capabilities.

Innovation Solution

A method involving a higher-intensity scanning beam and a lower-intensity stationary beam, where the scanning beam is phase, spatially, or temporally shifted relative to the stationary beam to detect radiation excited in a medium, allowing for aberration identification and correction using a detection device and wavefront shaping.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If pupil segmentation technique is used for aberration correction, then aberration correction capability is improved, but processing speed deteriorates (method is rather slow)

Engineering Contradiction:
Improveaberration correction capabilityVSAvoidprocessing speed
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent divides the wavefront into multiple segments and processes each segment independently through phase modulation. The back aperture is segmented into multiple zones, each contributing to correcting different aspects of the aberration, enabling parallel processing that improves speed while maintaining correction capability

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs periodic phase modulation of the laser beam across different temporal positions. By cycling through multiple phase states and measuring signals periodically, the system rapidly characterizes aberrations without requiring slow mechanical scanning, thus improving processing speed

Inventive Principle:
Principle #19Periodic action

2Reliability

If pupil segmentation technique is used for aberration correction, then aberration correction capability is improved, but the number of corrected wavefront segments is reduced

Engineering Contradiction:
Improveaberration correction capabilityVSAvoidnumber of corrected wavefront segments
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The patent applies different phase correction patterns to different spatial segments of the wavefront simultaneously. Each segment receives optimized phase modulation tailored to local aberration characteristics, allowing high correction capability across multiple wavefront segments through spatially-resolved phase control

Inventive Principle:
Principle #3Local quality

3Length of stationary object

If conventional aberration correction methods are used, then imaging depth is limited, but system complexity remains manageable

Engineering Contradiction:
Improveimaging depthVSAvoidsystem complexity
Core Design Contradiction:
Length of stationary objectVSDevice complexity

Solution Approach 1:

The patent replaces mechanical wavefront sensing and correction mechanisms with purely optical phase modulation and nonlinear optical signal detection. By using optical nonlinearities (two-photon excitation, harmonic generation) to encode wavefront information, the system achieves extended imaging depth through rapid optical processing without complex mechanical scanning or sensing apparatus

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables effective identification and correction of optical aberrations, improving imaging depth and resolution by deriving information about aberrations from photodetector signals and adapting the wavefront of the scanning beam, potentially achieving a diffraction-limited focus.

Implementation Method 1

detecting radiation (e.g. multi-photon excited fluorescence radiation) excited in the medium by the combined beam due to nonlinear effects

Methodology Applied
Scientific EffectNonlinear optical effects:

Implementation Method 2

detecting radiation (e.g. multi-photon excited fluorescence radiation) excited in the medium by the combined beam

Methodology Applied
Scientific EffectMulti-photon excited fluorescence: Fluorescence

Data Source

PatentEP3443399B1Method and arrangement for identifying optical aberrations
Publication Date: 2024.08.21 CHARITE UNIVS MEDIZIN BERLIN
  • EP3443399B1 patent drawingFigure 1
  • EP3443399B1 patent drawingFigure 2A~2B
  • EP3443399B1 patent drawing

AI summary

The invention relates to a method for identifying optical aberrations, comprising the steps of providing at least one first optical beam (B1) and a second optical beam (B2), wherein the intensity of one of the optical beams (B1) is higher than the intensity of the other optical beam (B2); creating a combined beam (CB) by at least partially superimposing the first and the second optical beam (B1, B2); focusing the combined beam (CB) into or through a medium (S) and detecting radiation excited in the medium (S) by the combined beam (CB) due to nonlinear optical effects; wherein the first beam (B1) is shifted in phase relative to the second beam (B2) to a plurality of phase positions, the first beam (B1) is spatially displaced relative to the second beam (B2) to a plurality of spatial positions and/or temporally shifted relative to the second beam (B2) to a plurality of time positions; detecting the radiation excited in the medium by the combined beam (CB) for each one of the phase positions, the spatial positions and/or the time positions of the first beam (B1), wherein the radiation is detected by means of a detection device (140); and identifying aberrations using signals generated by the detection device (140) for the plurality of the phase positions, the spatial positions and/or the time positions of the first beam relative to the second beam (B2) upon the detection of the radiation excited in the medium (S). The invention also is related to an arrangement for identifying optical aberrations.