Optical Biosensor Wavelength Tuning Across Manufacturing Variations
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Solution Overview
Problem
Existing biosensors face challenges in maintaining high detection capability due to manufacturing variations affecting the optimal light source wavelength, requiring time-consuming adjustments to film thicknesses and refractive indices of the reflective and optical waveguide layers.
Innovation Solution
Incorporation of a wavelength adjustment layer that allows for easy adjustment of the peak wavelength by varying its film thickness, without altering the reflection intensity difference, thereby stabilizing the detection performance across manufacturing variations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the film thicknesses and refractive indices of the reflective layer and optical waveguide layer are adjusted to maintain optimal detection performance, then detection capability is improved, but manufacturing time and complexity increase
Solution Approach 1:
The patent introduces a wavelength adjustment layer that is pre-configured with specific optical properties (refractive index and film thickness) to compensate for manufacturing variations. This preliminary design allows the biosensor to maintain optimal detection performance without requiring post-manufacturing adjustments to the reflective layer or optical waveguide layer, thereby resolving the contradiction between detection capability and adjustment time
2Measurement precision
If the film thicknesses and refractive indices are precisely controlled to maintain peak wavelength alignment, then detection sensitivity is improved, but manufacturing precision requirements increase
Solution Approach 1:
The patent changes the optical parameters (refractive index and film thickness) of the wavelength adjustment layer to compensate for variations in the reflective layer and optical waveguide layer. By adjusting these parameters, the system maintains the peak wavelength alignment and detection sensitivity even when manufacturing variations occur in other layers, thereby reducing the overall manufacturing precision requirements
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-sensitivity detection of specimens by aligning the peak wavelength with the measurement wavelength, enhancing stability and efficiency in biosensor performance.
Implementation Method 1
The light totally reflected by the upper surface of the reflective layer (the interface between the reflective layer and the optical waveguide layer) causes near-field light to bleed toward the optical waveguide layer
Implementation Method 2
the light totally reflected by the upper surface of the reflective layer (the interface between the reflective layer and the optical waveguide layer) causes near-field light to bleed toward the optical waveguide layer
Implementation Method 3
a wavelength adjustment layer located the substrate side, the optical waveguide layer side, or both the substrate side and the optical waveguide layer side of the reflective layer, and configured to shift a peak wavelength in a waveform indicating a first relationship between (i) a wavelength of the light and (ii) an intensity of the light reflected
Data Source
AI summary
An optical device includes: a substrate to transmit light; a reflective layer on the substrate; an optical waveguide layer to propagate the light transmitted through the reflective layer or near-field light bled from the reflective layer, the optical waveguide layer being on the reflective layer and having a surface with a functional group immobilizing a capturing body that captures a specimen; and a wavelength adjustment layer on the substrate side, the optical waveguide layer side, or both the substrate side and the optical waveguide layer side of the reflective layer, and configured to shift a peak wavelength in a waveform indicating a first relationship between (i) a wavelength of the light and (ii) an intensity of the light reflected by a surface of the reflective layer on the optical waveguide layer side or a surface of the optical waveguide layer opposite to the reflective layer under a total reflection condition.