Optical Characteristic Measurement Using Controlled Surface Reflection

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Solution Overview

Problem

Existing techniques for measuring optical characteristic values, such as scattering and absorption coefficients in scattering/absorbing bodies, fail to account for internal reflection at the surface, preventing the separate determination of these coefficients.

Innovation Solution

An optical characteristic value measuring device and method that includes a light emission unit, measurement unit, and a light reflection unit to increase surface reflectance, allowing calculation of absorption and scattering coefficients based on measured light intensities at multiple points.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of information

If a light is incident on a scattering/absorbing body and detected signals are obtained at three or more different incidence-detection distances, then internal information of the scattering/absorbing body can be extracted, but the scattering coefficient and absorption coefficient cannot be separately obtained due to unaccounted surface reflection

Engineering Contradiction:
Improveinternal information extractionVSAvoidseparate coefficient determination
Core Design Contradiction:
Loss of informationVSMeasurement precision

Solution Approach 1:

The patent introduces a light reflection means (such as a reflective plate or interface) as an intermediary element placed between the measurement means and the scattering/absorbing body. This intermediary creates a known reflection interface that allows the system to account for and separate surface reflection effects from internal scattering and absorption effects, enabling precise separate determination of scattering and absorption coefficients

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the optical parameter of the interface by introducing a light reflection means with specific reflectance properties. By controlling and knowing the reflection characteristics at the interface, the system can mathematically separate the contributions of surface reflection, internal scattering, and internal absorption, thereby resolving the contradiction between extracting internal information and precisely determining separate coefficients

Inventive Principle:
Principle #35Parameter changes

2Illumination intensity

If a light reflection means is placed to cover the surface between the light emission means and the measurement means, then the reflectance of light emitted from the inside to the outside is increased, but the device complexity increases

Engineering Contradiction:
Improvesurface reflectanceVSAvoiddevice structure
Core Design Contradiction:
Illumination intensityVSDevice complexity

Solution Approach 1:

The patent extracts the light reflection function from the complex interaction at the scattering/absorbing body surface and implements it through a separate, dedicated light reflection means. This modular approach allows the reflection function to be independently controlled and optimized without complicating the overall measurement system, as the reflection means can be a simple reflective plate or interface that is easily integrated

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The light reflection means creates a controlled optical copy or simulation of ideal reflection conditions at the measurement interface. By using a reflective plate or interface with known properties, the system replicates predictable reflection behavior that simplifies the mathematical modeling and data analysis, thereby reducing the effective complexity of interpreting measurement results

Inventive Principle:
Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the easy and accurate determination of scattering and absorption coefficients by enhancing surface reflectance and using computational methods to solve for these coefficients.

Implementation Method 1

a light emission means configured to emit a light from a surface to an inside of an object

Methodology Applied
Scientific EffectLight propagation: Light

Implementation Method 2

a light reflection means that is placed to cover the surface between the light emission means and the measurement means and is configured to increase a reflectance of the light emitted from the inside to the outside

Methodology Applied
Scientific EffectInternal reflection: Reflection

Implementation Method 3

a measurement means configured to measure an intensity of the light reflected at the inside and emitted to an outside of the object at at least two points on the surface mutually different in distance from the light emission means

Methodology Applied
Scientific EffectLight intensity measurement: Light

Implementation Method 4

a computing means configured to calculate an absorption coefficient and a scattering coefficient of the object based on the intensity obtained by the measurement

Methodology Applied
Scientific EffectAbsorption: Absorption (EM radiation)

Implementation Method 5

a computing means configured to calculate an absorption coefficient and a scattering coefficient of the object based on the intensity obtained by the measurement

Methodology Applied
Scientific EffectScattering: Scattering

Data Source

PatentUS20250251343A1Optical characteristic value measurement device and optical characteristic value measurement method
Publication Date: 2025.08.07 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE & TECHNOLOGY
  • US20250251343A1 patent drawing
  • US20250251343A1 patent drawing
  • US20250251343A1 patent drawing

AI summary

An optical characteristic value measuring device provided with a detection unit that includes a light emission unit configured to emit a light from a surface to an inside of an object, a measurement unit configured to measure an intensity of the light reflected at the inside and emitted to an outside of the object at at least two points on the surface mutually different in distance from the light emission unit, and a base plate that is placed to cover the surface between the light emission unit and the measurement unit and increases a reflectance of the light emitted from the inside to the outside, and a computing unit configured to calculate an absorption coefficient and a scattering coefficient of the object based on the intensity obtained by the measurement.