Device for determining optical properties of an optically transparent substrate and coating system

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Solution Overview

Problem

Existing devices for determining the optical properties of optically transparent substrates, such as those used in building glazing and solar modules, struggle to simultaneously measure transmission and reflection, leading to increased measurement times and difficulty in precise determination, especially when the substrate is moving.

Innovation Solution

A device with dual measuring units on opposite sides of the substrate, allowing simultaneous measurement of reflection and transmission using directed electromagnetic radiation, with adjustable emission angles and rapid switching between modes, enabling precise and efficient optical property determination.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single measuring unit is used to measure transmission and reflection sequentially, then the device complexity is reduced, but the measurement time increases and measurement precision deteriorates

Engineering Contradiction:
Improvemeasuring unit configurationVSAvoidmeasurement time
Core Design Contradiction:
Device complexityVSLoss of time

Solution Approach 1:

The measuring device is segmented into two separate measuring units: a first measuring unit for measuring reflection properties and a second measuring unit for measuring transmission properties. Each unit has its own emission unit and detector unit, allowing simultaneous independent measurements without interference, thus reducing total measurement time while maintaining device functionality.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Both measuring units share common components including a single substrate, emission units that can operate in both measurement paths, and detector units that can receive signals from both reflection and transmission paths. This merging of components reduces overall device complexity while enabling simultaneous measurements through proper configuration.

Inventive Principle:
Principle #5Merging (Combining)

2Device complexity

If sequential measurement of transmission and reflection is performed, then device structure is simplified, but manufacturing precision and measurement accuracy deteriorate due to substrate movement

Engineering Contradiction:
Improvemeasuring unit configurationVSAvoidsubstrate property determination accuracy
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The measurement system is divided into two simultaneous measurement paths (reflection and transmission) using separate measuring units. This segmentation allows both measurements to be captured at the exact same moment on the moving substrate, eliminating errors caused by substrate movement between sequential measurements and improving manufacturing precision.

Inventive Principle:
Principle #1Segmentation

3Device complexity

If emission units are oriented perpendicular to substrate surface, then the measurement setup is simplified, but the ability to simultaneously measure reflection and transmission is lost

Engineering Contradiction:
Improveemission unit orientationVSAvoidsimultaneous measurement capability
Core Design Contradiction:
Device complexityVSProductivity

Solution Approach 1:

The emission units are segmented into different orientations: one emission unit is oriented perpendicular to the substrate surface for transmission measurement, while another emission unit is oriented at an angle for reflection measurement. This segmentation of emission paths enables simultaneous measurement of both reflection and transmission properties without compromising either measurement quality.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The device enables rapid and precise determination of optical properties by minimizing measurement time and range, facilitating high-resolution analysis of substrates with varying coatings and viewing angles, and supporting flexible manufacturing processes.

Implementation Method 1

a first emission unit for irradiating a measuring area of the substrate with directed electromagnetic radiation

Methodology Applied
Scientific EffectElectromagnetic radiation: Light

Implementation Method 2

the electromagnetic radiation reflected by the substrate coating in the measuring area can be detected in the first detector unit

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 3

the electromagnetic radiation transmitted by the substrate in the measuring area can be detected in the second detector unit

Methodology Applied
Scientific EffectTransmission: Light

Data Source

PatentEP4400833B1Device for determining optical properties of an optically transparent substrate and coating system
Publication Date: 2026.03.04 BUHLER ALZENAU GMBH
  • EP4400833B1 patent drawingFigure 1~2
  • EP4400833B1 patent drawingFigure 3
  • EP4400833B1 patent drawingFigure 4

AI summary

A device (24) for determining the optical properties of an optically transparent substrate (14) provided on a first side (36) with a substrate coating (12) has a first operating mode and a second operating mode, wherein in the first operating mode a first emission unit (40) is active and a second emission unit (58) is inactive, and in the second operating mode the first emission unit (40) is inactive and the second emission unit (58) is active, such that reflected and transmitted electromagnetic radiation can be detected by a first detector unit (50) and a second detector unit (60), respectively, in the operating modes. A coating system (10) is also specified.