Optical Component Measurement Device Abnormality Detection
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Solution Overview
Problem
Existing component measurement devices require a special member for detecting abnormalities in component measurement chips, making the detection process complex.
Innovation Solution
A component measurement device that includes a chip insertion space, a light emitting unit, a light receiving unit, and a control unit, which detects abnormality in the component measurement chip by calculating the ratio of received light intensities at specific and alternative wavelengths.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a special member (reference pad or test chemical substance) is disposed in the component measurement chip for detecting abnormality, then the abnormality detection capability is improved, but the device complexity increases
Solution Approach 1:
The component measurement chip performs self-diagnosis by measuring its own optical characteristics at multiple wavelengths. The control unit calculates the ratio of light intensities at different wavelengths to detect abnormalities, eliminating the need for external reference pads or special test members. The chip serves both as the measurement target and the reference standard simultaneously.
Solution Approach 2:
The system detects abnormalities by measuring changes in optical parameters (light intensity ratios) at multiple wavelengths. By monitoring the ratio of light intensities at different wavelengths, the system can identify deterioration of the component measurement chip without adding physical reference structures, thus maintaining simplicity while improving detection reliability.
2Measurement precision
If multiple wavelengths are used for measuring light intensity ratio to detect abnormality, then the measurement precision is improved, but the use of energy increases
Solution Approach 1:
The light emitting unit emits light at multiple wavelengths in a sequential or periodic manner rather than simultaneously. The control unit measures light intensities at each wavelength separately, calculating the ratio to detect abnormalities. This periodic measurement approach improves detection precision through multi-wavelength analysis while managing energy consumption by activating only one wavelength at a time.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the detection of abnormalities in component measurement chips without the need for a special member, simplifying the detection process and improving accuracy.
Implementation Method 1
a light receiving unit that receives light that has passed through or has been reflected by the component measurement chip
Implementation Method 2
a light receiving unit that receives light that has passed through or has been reflected by the component measurement chip
Implementation Method 3
the control unit detects abnormality of the component measurement chip on the basis of a ratio, to a received light intensity in the light receiving unit when irradiation light having a specific wavelength is emitted from the light emitting unit, of a received light intensity in the light receiving unit when irradiation light having another wavelength is emitted from the light emitting unit
Data Source
AI summary
A component measurement device includes: a chip insertion space into which a component measurement chip is insertable; a light emitting unit configured to emit irradiation light to the component measurement chip in a state in which the component measurement chip is located in the chip insertion space; a light receiving unit configured to receive light that has passed through or has been reflected by the component measurement chip; and a control unit configured to detect abnormality of the component measurement chip on a basis of a ratio of (i) a received light intensity in the light receiving unit when irradiation light having a first wavelength is emitted from the light emitting unit to (ii) a received light intensity in the light receiving unit when irradiation light having a second wavelength is emitted from the light emitting unit.